Charge collection and absorption-limited sensitivity of x-ray photoconductors:: Applications to a-Se and HgI2

被引:98
作者
Kabir, MZ [1 ]
Kasap, SO [1 ]
机构
[1] Univ Saskatchewan, Dept Elect Engn, Saskatoon, SK S7N 5A9, Canada
关键词
Absorption-limited - Charge collection - Continuity equations - Drift of electrons - Normalized sensitivity - Polycrystalline - Sensitivity model - X-ray photoconductor;
D O I
10.1063/1.1454213
中图分类号
O59 [应用物理学];
学科分类号
摘要
A generalized expression for charge carrier transport and absorption-limited sensitivity of x-ray photoconductors is derived by analytically solving the continuity equation for both holes and electrons considering the drift of electrons and holes in the presence of deep traps. The normalized sensitivity equation is applied to stabilized a-Se and HgI2. In the latter case, the sensitivity model is fitted to published data to determine the electron and hole ranges (6.4x10(-6) cm(2)/V and 7x10(-8) cm(2)/V, respectively) in screen-printed polycrystalline HgI2. (C) 2002 American Institute of Physics.
引用
收藏
页码:1664 / 1666
页数:3
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