Supression of carrier recombination in semiconductor lasers by phase-space filling

被引:70
作者
Hader, J [1 ]
Moloney, JV
Koch, SW
机构
[1] Univ Arizona, Ctr Opt Sci, Tucson, AZ 85721 USA
[2] Univ Marburg, Dept Phys, D-35032 Marburg, Germany
[3] Univ Marburg, Ctr Mat Sci, D-35032 Marburg, Germany
关键词
D O I
10.1063/1.2132524
中图分类号
O59 [应用物理学];
学科分类号
摘要
A fully microscopic model is used to calculate the carrier losses in semiconductor lasers due to Auger recombination and spontaneous emission. The results show that the commonly assumed power-law dependencies of these loss processes on the plasma density break down already below the transparency point. Most significantly, the density dependent increase of the spontaneous emission changes from quadratic to linear, while the increase of the Auger recombination is reduced from cubic to approximately quadratic or even less. (C) 2005 American Institute of Physics.
引用
收藏
页码:1 / 3
页数:3
相关论文
共 10 条
[1]  
Agrawal G, 1986, LONG WAVELENGTH SEMI
[2]   Spontaneous emission in highly excited semiconductors: Saturation of the radiative recombination rate [J].
Bourdon, G ;
Robert, I ;
Sagnes, I ;
Abram, I .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (11) :6595-6600
[3]   A quantitative study of radiative, Auger, and defect related recombination processes in 1.3-μm GaInNAs-based quantum-well lasers [J].
Fehse, R ;
Tomic, S ;
Adams, AR ;
Sweeney, SJ ;
O'Reilly, EP ;
Andreev, A ;
Riechert, H .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2002, 8 (04) :801-810
[4]   CARRIER-DENSITY-INDEPENDENT RADIATIVE CONSTANT IN 1.3 MU-M BURIED HETEROSTRUCTURE LASERS [J].
FLYNN, EJ .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (06) :4046-4053
[5]   Microscopic evaluation of spontaneous emission- and Auger-processes in semiconductor lasers [J].
Hader, J ;
Moloney, JV ;
Koch, SW .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 2005, 41 (10) :1217-1226
[6]   Microscopic modeling of gain and luminescence in semiconductors [J].
Hader, J ;
Moloney, JV ;
Koch, SW ;
Chow, WW .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2003, 9 (03) :688-697
[7]   Microscopic theory of gain and spontaneous emission in GaInNAs laser material [J].
Hader, J ;
Koch, SW ;
Moloney, JV .
SOLID-STATE ELECTRONICS, 2003, 47 (03) :513-521
[8]   CARRIER LIFETIME SATURATION IN INGAAS SINGLE QUANTUM-WELLS [J].
ONGSTAD, AP ;
GALLANT, DJ ;
DENTE, GC .
APPLIED PHYSICS LETTERS, 1995, 66 (20) :2730-2732
[9]   The temperature dependence of 1.3-and 1.5-μm compressively strained InGaAs(P) MQW semiconductor lasers [J].
Phillips, AF ;
Sweeney, SJ ;
Adams, AR ;
Thijs, PJA .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 1999, 5 (03) :401-412
[10]   CARRIER LIFETIME MEASUREMENT FOR DETERMINATION OF RECOMBINATION RATES AND DOPING LEVELS OF III-V SEMICONDUCTOR LIGHT-SOURCES [J].
SU, CB ;
OLSHANSKY, R .
APPLIED PHYSICS LETTERS, 1982, 41 (09) :833-835