Spontaneous emission in highly excited semiconductors: Saturation of the radiative recombination rate

被引:23
作者
Bourdon, G [1 ]
Robert, I [1 ]
Sagnes, I [1 ]
Abram, I [1 ]
机构
[1] CNRS, Lab Photon & Nanostruct, F-91460 Marcoussis, France
关键词
D O I
10.1063/1.1519344
中图分类号
O59 [应用物理学];
学科分类号
摘要
The spontaneous emission rate of semiconductors displays a saturation at high carrier injection densities due to the filling of the conduction and valence bands. We have carried out time-resolved experiments, whereby a semiconductor quantum well at room temperature is excited optically by a short laser pulse and the time decay of its luminescence is measured for different injected carrier densities. The luminescence decay rate, plotted as a function of injected carrier density, deviates strongly from the well-known quadratic recombination law, valid at low carrier densities, displaying a saturation. We have developed a simple analytic theory that accounts for this saturation and can describe adequately the recombination kinetics of highly excited semiconductor quantum wells. (C) 2002 American Institute of Physics.
引用
收藏
页码:6595 / 6600
页数:6
相关论文
共 10 条
[1]  
Bebb H.B., 1972, Semiconductors and Semimetals, V8, P181, DOI DOI 10.1016/S0080-8784(08)62345-5
[2]   TIME-RESOLVED MEASUREMENTS OF THE RADIATIVE RECOMBINATION IN GAAS/ALXGA1-XAS HETEROSTRUCTURES [J].
BERGMAN, JP ;
ZHAO, QX ;
HOLTZ, PO ;
MONEMAR, B ;
SUNDARAM, M ;
MERZ, JL ;
GOSSARD, AC .
PHYSICAL REVIEW B, 1991, 43 (06) :4771-4776
[3]   Room temperature enhancement and inhibition of spontaneous emission in semiconductor microcavities [J].
Bourdon, G ;
Robert, I ;
Adams, R ;
Nelep, K ;
Sagnes, I ;
Moison, JM ;
Abram, I .
APPLIED PHYSICS LETTERS, 2000, 77 (09) :1345-1347
[4]  
Casey Jr H. C., 1978, HETEROSTRUCTURE LASE
[5]   THEORETICAL GAIN IN STRAINED INGAAS/ALGAAS QUANTUM-WELLS INCLUDING VALENCE-BAND MIXING EFFECTS [J].
CORZINE, SW ;
YAN, RH ;
COLDREN, LA .
APPLIED PHYSICS LETTERS, 1990, 57 (26) :2835-2837
[6]   OBSERVATIONS AND CALCULATIONS OF THE EXCITON BINDING-ENERGY IN (IN,GA)AS/GAAS STRAINED-QUANTUM-WELL HETEROSTRUCTURES [J].
MOORE, KJ ;
DUGGAN, G ;
WOODBRIDGE, K ;
ROBERTS, C .
PHYSICAL REVIEW B, 1990, 41 (02) :1090-1094
[7]   MEASUREMENT OF RADIATIVE AND NONRADIATIVE RECOMBINATION RATES IN INGAASP AND ALGAAS LIGHT-SOURCES [J].
OLSHANSKY, R ;
SU, CB ;
MANNING, J ;
POWAZINIK, W .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1984, 20 (08) :838-854
[8]   Picosecond photoluminescence studies of carrier escape processes in a GaAs/Al0.3Ga0.7As single quantum well [J].
Thucydides, G ;
Barnes, JM ;
Tsui, E ;
Barnham, KWJ ;
Phillips, CC ;
Cheng, TS ;
Foxon, CT .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1996, 11 (03) :331-339
[9]   MEASUREMENT OF NONRADIATIVE AUGER AND RADIATIVE RECOMBINATION RATES IN STRAINED-LAYER QUANTUM-WELL SYSTEMS [J].
WANG, MC ;
KASH, K ;
ZAH, CE ;
BHAT, R ;
CHUANG, SL .
APPLIED PHYSICS LETTERS, 1993, 62 (02) :166-168
[10]   CARRIER RECOMBINATION RATE IN GAAS-ALGAAS SINGLE QUANTUM-WELL LASERS UNDER HIGH-LEVELS OF EXCITATION [J].
WANG, P ;
LEE, KK ;
YAO, G ;
CHEN, YC ;
WATERS, RG .
APPLIED PHYSICS LETTERS, 1990, 56 (21) :2083-2085