Influence of seed layer on crystal orientation and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films prepared by a sol-gel process

被引:11
作者
Chi, Q. G. [1 ,2 ,3 ]
Yang, F. Y. [1 ]
Zhang, C. H. [1 ]
Chen, C. T. [1 ]
Zhu, H. F. [1 ]
Wang, X. [2 ]
Lei, Q. Q. [2 ]
机构
[1] Harbin Univ Sci & Technol, Sch Appl Sci, Harbin 150080, Peoples R China
[2] Harbin Univ Sci & Technol, Minist Educ, Key Lab Engn Dielect & Its Applicat, Harbin 150080, Peoples R China
[3] Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China
基金
美国国家科学基金会;
关键词
Films; Sol-gel process; Interfaces; Electrical properties; EVOLUTION;
D O I
10.1016/j.ceramint.2013.05.035
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Sol gel derived lead-free (Na0.85K0.15)(0.5)Bi0.5TiO3 (NKBT) thin films, with and without a Pb0.8La0.1Ca0.1Ti0.975O3 (PLCT) seed layer, were fabricated on (111)Pt/Ti/SiO2/Si substrates. The influences of the seed layer on crystal orientation and electrical properties were investigated in detail. XRD indicated that the NKBT thin films fabricated with a seed layer were fully crystallized into a single perovskite structure, while the films fabricated under the same conditions, but without a seed layer, possessed a certain amount of pyrochlore phase. The NKBT film with a 14 nm-thick seed layer showed high (100) orientation, and exhibited enhanced electrical properties, such as a higher remanent polarization (Pr similar to 18 mu C/cm(2)), a lower dielectric loss tangent (tan delta similar to 0.023) and smaller transient current density (J < 10(-5) A/cm(2)). (C) 2013 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
引用
收藏
页码:9273 / 9276
页数:4
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