We have studied the interface formed between a p-type conducting polyaniline layer and an n-type porous silicon wafer, The contact has rectifying behaviour demonstrated clearly by the IV curves, We can fit our data to a simple Schottky barrier model. The barrier height determined from our data varies from 0.78 to 0.85eV. The ideality factor ranges from 2.8 - 5.2. Visible electroluminescence has been obtained from this junction when it is placed under a forward bias.