The influence of the external field on transmission electron microscopy observations of electric fields at interfaces

被引：13

作者：

Pozzi, G ^{[1
]}

机构：

[1] UNIV BOLOGNA,IST NAZL FIS MAT,I-40127 BOLOGNA,ITALY

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1996年 / 29卷 / 07期

关键词：

D O I：

10.1088/0022-3727/29/7/015

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The aim of this paper is to show how old results obtained for the interpretation of transmission electron microscopy observations of reverse-biased p-n junctions can be updated and used for the case of electric fields arising at charged interfaces. In particular the effect of the external field on holographic and Fresnel images is investigated.

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页码：1807 / 1811

页数：5

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