Influence of relative thickness on multiferroic properties of bilayered Pb(Zr0.52Ti0.48)O3-CoFe2O4 thin films

被引:43
作者
He, Hong-cai [1 ,2 ,3 ,4 ]
Ma, Jing [1 ,2 ]
Lin, Yuanhua [1 ,2 ]
Nan, C. W. [1 ,2 ]
机构
[1] Tsinghua Univ, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
[2] Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
[3] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Sichuan, Peoples R China
[4] Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Sichuan, Peoples R China
关键词
D O I
10.1063/1.3035851
中图分类号
O59 [应用物理学];
学科分类号
摘要
Multiferroic bilayered thin films consisting of Pb(Zr0.52Ti0.48)O-3 (PZT) and CoFe2O4 (CFO) layers of different relative thicknesses were prepared on a general Pt/Ti/SiO2/Si substrate via a simple solution processing. The influence of the thickness fraction on their properties including ferroelectric, ferromagnetic, and magnetoelectric properties in the PZT-CFO bilayered thin films was investigated. Our results showed that the thickness fractions (or relative thicknesses) of the layers have a significant effect not only on the magnetic and electric properties of the bilayered films but also on their magnetoelectric response. The bilayered thin films with the intermediate thickness fraction of around 0.6 exhibited a maximum magnetoelectric effect. (c) 2008 American Institute of Physics. [DOI: 10.1063/1.3035851]
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页数:6
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