共 5 条
[1]
Ab initio study of intrinsic point defects and dopant-defect complexes in SiC: Application to boron diffusion
[J].
SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2,
2000, 338-3
:949-952
[3]
Self diffusion in SiC: the role of intrinsic point defects
[J].
SILICON CARBIDE AND RELATED MATERIALS, ECSCRM2000,
2001, 353-356
:323-326
[5]
DII revisited in an modern guise -: 6H- and 4H-SiC
[J].
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2,
1998, 264-2
:493-496