共 103 条
[7]
Comparison of the lithographic properties of positive resists upon exposure to deep- and extreme-ultraviolet radiation
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1999, 17 (06)
:3384-3389
[8]
Intel's EUV resist development
[J].
ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XX, PTS 1 AND 2,
2003, 5039
:484-491
[10]
Materials for future lithography
[J].
ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XXII, PT 1 AND 2,
2005, 5753
:1-9