Modelling and simulation of reliability for design

被引：11

作者：

Mathewson, A ^{[1
]}

O'Sullivan, P ^{[1
]}

Concannon, A ^{[1
]}

Foley, S ^{[1
]}

Minehane, S ^{[1
]}

Duane, R ^{[1
]}

Palser, K ^{[1
]}

机构：

[1] Natl Univ Ireland Univ Coll Cork, Natl Microelect Res Ctr, Cork, Ireland

来源：

MICROELECTRONIC ENGINEERING | 1999年 / 49卷 / 1-2期

关键词：

D O I：

10.1016/S0167-9317(99)00432-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper provides a review of the use of simulation tools in the design process. It provides examples of applications where such tools can be effective in improving device functionality: yield, manufacturability and reliability. Topics covered are numerical process and device simulation, electromigration and stress migration simulation as well as circuit simulation and reliability modelling. Specific example of how such simulators work are provided and examples of currently available software tools are reviewed.

引用

页码：95 / 117

页数：23

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