IBM experiments in soft fails in computer electronics (1978-1994)

被引：205

作者：

Ziegler, JF

Curtis, HW

Muhlfeld, HP

Montrose, CJ

Chin, B

Nicewicz, M

Russell, CA

Wang, WY

Freeman, LB

Hosier, P

LaFave, LE

Walsh, JL

Orro, JM

Unger, GJ

Ross, JM

OGorman, TJ

Messina, B

Sullivan, TD

Sykes, AJ

Yourke, H

Enger, TA

Tolat, V

Scott, TS

Taber, AH

Sussman, RJ

Klein, WA

Wahaus, CW

机构：

[1] IBM CORP, MICROELECTR DIV, E FISHKILL FACIL, HOPEWELL JCT, NY 12533 USA

[2] IBM CORP, MICROELECTR DIV, BURLINGTON FACIL, ESSEX JCT, VT 05452 USA

[3] IBM CORP, SYST TECHNOL & ARCHITECTURE DIV, AUSTIN, TX 78758 USA

[4] PERSONAL COMP CO, RES TRIANGLE PK, NC 27709 USA

[5] IBM SYST, DIV 390, POUGHKEEPSIE, NY 12601 USA

[6] LORAL FED SYST CO, OSWEGO, NY 13827 USA

[7] IBM CORP, SOMERS, NY 10589 USA

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1996年 / 40卷 / 01期

关键词：

D O I：

10.1147/rd.401.0003

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.

引用

页码：3 / 18

页数：16

共 33 条

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