Time delay and integration imaging for internal profile inspection

被引：10

作者：

Tay, CJ ^{[1
]}

Toh, SL ^{[1
]}

Shang, HM ^{[1
]}

机构：

[1] Natl Univ Singapore, Dept Mech & Prod Engn, Singapore 119260, Singapore

来源：

OPTICS AND LASER TECHNOLOGY | 1998年 / 30卷 / 08期

关键词：

time delay and integration imaging; internal profile; inspection; profilometer;

D O I：

10.1016/S0030-3992(98)00078-4

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A time delay and integration imaging technique is presented and applied to internal surface contour measurement. Using the proposed optical arrangement, inspection of profiles of objects which are mounted on the internal surface of a hollow cylinder can be carried out. Tests conducted on objects with diameters ranging from 40 to 214 mm show good agreement with results obtained from conventional profilometer. (C) 1999 Elsevier Science Ltd. All rights reserved.

引用

页码：459 / 465

页数：7

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