Hydrothermal and electrochemical growth of complex oxide thin films for electronic devices

被引:14
作者
Kajiyoshi, K
Yanagisawa, K
Yoshimura, M
机构
[1] Kochi Univ, Res Lab Hydrothermal Chem, Fac Sci, Kochi 7808520, Japan
[2] Tokyo Inst Technol, Ctr Mat Design, Mat & Struct Lab, Yokohama, Kanagawa 2268503, Japan
关键词
films; dielectric properties; BaTiO3 and titanates; tantalates; niobates;
D O I
10.1016/j.jeurceramsoc.2005.07.022
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Thin film growth of complex oxides including BaTiO3, SrTiO3, BaZrO3, SrZrO3. KTaO3, and KNbO3 were studied by the hydrothermal and the hydrothermal-electrochemical methods. Hydrothermal-electrochemical growth of ATiO(3) (A = Ba, Sr) thin films was investigated at temperatures from 100 to 200 degrees C using a three-electrode cell. Current efficiency for the film growth was in the range from ca. 0.6 to 3.0%. Tracer experiments revealed that the ATiO(3) film grows at the film/substrate interface. Thin films of AZrO(3) (A = Ba, Sr) were also prepared oil Zr metal substrates by the hydrothermal-electrochemical method. By applying a potential above ca. +2 V versus Ag/AgCl to the Zr substrates, AZrO(3) thin films were formed uniformly. Thin films of KTaO3 and KNbO3 were prepared on Ta metal substrates by the hydrothermal method. Perovskite-type KTaO3 thin films were formed in 2.0 M KOH at 300 degrees C. Pyrochlore-type K2Ta2O6 thin films were formed at lower temperatures and lower KOH concentrations. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:605 / 611
页数:7
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