Scanning magnetoresistance microscopy with a magnetoresistive sensor cantilever

被引：26

作者：

Nakamura, M ^{[1
]}

Kimura, M ^{[1
]}

Sueoka, K ^{[1
]}

Mukasa, K ^{[1
]}

机构：

[1] Hokkaido Univ, Grad Sch Engn, Kita Ku, Sapporo, Hokkaido 0608628, Japan

来源：

APPLIED PHYSICS LETTERS | 2002年 / 80卷 / 15期

关键词：

D O I：

10.1063/1.1469681

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this work, a cantilever with a magnetoresistive (MR) sensor is fabricated for scanning magnetoresistance microscope, in order to realize the simultaneous imaging of surface topography and stray magnetic field distribution. A constant current flowing through a meander-patterned metal wire produces a defined magnetic field, and the wire is used as a sample to demonstrate the simultaneous imaging and to reveal the field sensitivity of the cantilever. A MR image has been successfully obtained with lateral spatial resolution of a few mum and a field sensitivity (H(min)approximate to1.7 Oe) at room temperature. (C) 2002 American Institute of Physics.

引用

页码：2713 / 2715

页数：3

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