Acceleration Kinetics of PEG, PPG, and a Triblock Copolymer by SPS during Copper Electroplating

被引:67
作者
Gallaway, Joshua W. [1 ]
Willey, Mark J. [2 ]
West, Alan C. [1 ]
机构
[1] Columbia Univ, Dept Chem Engn, New York, NY 10027 USA
[2] Novellus Syst Inc, Tualatin, OR 97062 USA
关键词
adsorption; copper; current density; electrochemical electrodes; electroplating; ohmic contacts; polymer blends; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; POLYETHYLENE-GLYCOL; SUPERCONFORMAL ELECTRODEPOSITION; ADDITIVES; ACID; ADSORPTION; CHLORIDE; MODEL; DESORPTION; DEPOSITION;
D O I
10.1149/1.3078405
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Three copper-plating suppressors are examined in three-additive baths: a polyethylene glycol (PEG), a polypropylene glycol (PPG), and a triblock copolymer of the two. Bis(3-sulfopropyl)-disulfide (SPS) is found to transition each to a state of nonsuppression, i.e., accelerate each, at a rate dependent on the suppressor molecule, the SPS concentration, and, to a lesser extent, the suppressor concentration. Using a planar microscale working electrode (d=100 mu m), the kinetic currents of the plating reactions are observed without the influence of ohmic resistance, revealing far higher current densities than previously reported. Potentiostatic and galvanostatic experiments of additive adsorption at short times, t < 20 s, are compared quantitatively using a surface-blocking model to transform the data to effective surface coverage, theta(EFF), vs time. A major difference is found in SPS acceleration between galvanostatic and potentiostatic experiments, with the rate of change in suppression being proportional to the current density. This results in a constant rate of change in theta(EFF) under constant current but a self-reinforcing rate of change in theta(EFF) at constant potential. A simple additive model is introduced to characterize the results.
引用
收藏
页码:D146 / D154
页数:9
相关论文
共 33 条
[1]   A time-dependent transport-kinetics model for additive interactions in copper interconnect metallization [J].
Akolkar, R ;
Landau, U .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2004, 151 (11) :C702-C711
[2]  
Akolkar R., 2007, ECS Transactions, V2, P13
[3]   Future directions in electroplated materials for thin-film recording heads [J].
Andricacos, PC ;
Robertson, N .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1998, 42 (05) :671-680
[4]   Damascene copper electroplating for chip interconnections [J].
Andricacos, PC ;
Uzoh, C ;
Dukovic, JO ;
Horkans, J ;
Deligianni, H .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1998, 42 (05) :567-574
[5]   Three-additive model of superfilling of copper [J].
Cao, Y ;
Taephaisitphongse, P ;
Chalupa, R ;
West, AC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2001, 148 (07) :C466-C472
[6]   Microvia filling over self-assembly disulfide molecule on Au and Cu seed layers - A morphological study of copper deposits [J].
Dow, WP ;
Yen, MY .
ELECTROCHEMICAL AND SOLID STATE LETTERS, 2005, 8 (11) :C161-C165
[7]   Inhibition due to the interaction of polyethylene glycol, chloride, and copper in plating baths: A surface-enhanced Raman study [J].
Feng, ZV ;
Li, X ;
Gewirth, AA .
JOURNAL OF PHYSICAL CHEMISTRY B, 2003, 107 (35) :9415-9423
[8]   The decomposition of the sulfonate additive sulfopropyl sulfonate in acid copper electroplating chemistries [J].
Frank, A ;
Bard, AJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2003, 150 (04) :C244-C250
[9]   PEG, PPG, and their triblock copolymers as suppressors in copper electroplating [J].
Gallaway, Joshua W. ;
West, Alan C. .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2008, 155 (10) :D632-D639
[10]   THE CHEMISTRY OF THE ADDITIVES IN AN ACID COPPER ELECTROPLATING BATH .1. POLYETHYLENE-GLYCOL AND CHLORIDE-ION [J].
HEALY, JP ;
PLETCHER, D ;
GOODENOUGH, M .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1992, 338 (1-2) :155-165