On the importance of fifth-order spherical aberration for a fully corrected electron microscope

被引:39
作者
Chang, LY [1 ]
Kirkland, AI [1 ]
Titchmarsh, JM [1 ]
机构
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
基金
英国工程与自然科学研究理事会;
关键词
C-s and C-c-corrected microscope; phase contrast theory;
D O I
10.1016/j.ultramic.2005.09.004
中图分类号
TH742 [显微镜];
学科分类号
摘要
Next generation aberration correctors will not only eliminate the third-order spherical aberration, but also improve the information limit by correction of chromatic aberration. As a result of these improvements, higher order aberrations, which have largely been neglected in image analysis, will become important. In this paper, we concern ourselves with situations where sub-A resolution can be achieved, and where the third-order spherical aberration is corrected and the fifth-order spherical aberration is measurable. We derive formulae to explore the maximum value of the fifth-order spherical aberration for directly interpretable imaging and discuss the optimum imaging conditions and their applicable range. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:301 / 306
页数:6
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