Scanning probe microscopy of heterogeneous polymers

被引：36

作者：

Marti, O ^{[1
]}

Stifter, T ^{[1
]}

Waschipky, H ^{[1
]}

Quintus, M ^{[1
]}

Hild, S ^{[1
]}

机构：

[1] Univ Ulm, D-89069 Ulm, Germany

来源：

COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS | 1999年 / 154卷 / 1-2期

关键词：

scanning probe microscopy; heterogeneous polymers; pulsed force mode;

D O I：

10.1016/S0927-7757(98)00909-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Adhesion, elastic and viscoelastic properties are characteristic parameters of materials. These mechanical properties of polymers show a strong dependence on the manufacturing process, the molecular weight, the temperature and the environment. It would be desirable to have tools for characterization of small samples. The scanning force microscope seems to be an ideal instrument when working towards this goal. The nanometer sized probe in contact with the sample surface can be used to measure a variety of surface properties, ranging from friction to adhesion. The measurements could be truly quantitative if one knew exactly the shape of the tip and the strength and distance dependence of the interaction forces. It is shown in this paper how the measurement modes of a scanning force microscope can be tailored to obtain quantitative data. We discuss the advantages and disadvantages of the pulsed force mode investigations using homogeneous and heterogeneous polymer samples as test objects. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：65 / 73

页数：9

共 28 条

[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].