Band gaps, effective masses and refractive indices of PbSrSe thin films: Key properties for mid-infrared optoelectronic device applications

被引:36
作者
Shen, WZ
Yang, HF
Jiang, LF
Wang, K
Yu, G
Wu, HZ
McCann, PJ
机构
[1] Shanghai Jiao Tong Univ, Dept Phys, Lab Condensed Matter Spect & Optoelect Phys, Shanghai 200030, Peoples R China
[2] Univ Oklahoma, Sch Elect & Comp Engn, Norman, OK 73019 USA
[3] Univ Oklahoma, Lab Elect Properties Mat, Norman, OK 73019 USA
关键词
D O I
10.1063/1.1421634
中图分类号
O59 [应用物理学];
学科分类号
摘要
Key properties of PbSrSe thin films grown by molecular beam epitaxy have been studied for mid-infrared optoelectronic device applications. Detailed knowledge of the material parameters for the device design is required. The material parameters considered are: temperature-dependent band gaps, composition (or band gap)-dependent effective masses, and energy-dependent refractive indices. The study has been carried out by a combination of temperature-dependent photoluminescence and absorption measurements with the theoretical models on PbSrSe thin films of Sr compositions of as high as 0.276. The derived empirical equations for band gaps, effective masses, and refractive indices have been employed successfully in PbSe/Pb0.934Sr0.066Se multiple quantum well mid-infrared laser systems, for studying the band offsets and subband behavior. We have shown that the derived material parameters clearly promise of being applied to other PbSrSe thin films and PbSe/PbSrSe heterostructure systems for their optoelectronic applications. (C) 2002 American Institute of Physics.
引用
收藏
页码:192 / 198
页数:7
相关论文
共 20 条
[1]  
CASEY HC, 1978, HETEROSTRUCTURE LA A
[2]  
CASEY HC, 1978, HETEROSTRUCTURE LA B
[3]   ENERGY-GAP VERSUS ALLOY COMPOSITION AND TEMPERATURE IN HG1-XCDXTE [J].
CHU, JH ;
XU, SH ;
TANG, DY .
APPLIED PHYSICS LETTERS, 1983, 43 (11) :1064-1066
[4]   Molecular beam epitaxy of PbSrSe and PbSe/PbSrSe multiple quantum well structures for use in midinfrared light emitting devices [J].
Fang, XM ;
Namjou, K ;
Chao, IN ;
McCann, PJ ;
Dai, N ;
Tor, G .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (03) :1720-1723
[5]   OPTICAL-PROPERTIES OF CRYSTALLINE SEMICONDUCTORS AND DIELECTRICS [J].
FOROUHI, AR ;
BLOOMER, I .
PHYSICAL REVIEW B, 1988, 38 (03) :1865-1874
[6]   OPTICAL DISPERSION-RELATIONS FOR AMORPHOUS-SEMICONDUCTORS AND AMORPHOUS DIELECTRICS [J].
FOROUHI, AR ;
BLOOMER, I .
PHYSICAL REVIEW B, 1986, 34 (10) :7018-7026
[7]   CARRIER LOCALIZATION IN LOW-BANDGAP HG1-XCDXTE CRYSTALS, STUDIED BY PHOTOLUMINESCENCE [J].
FUCHS, F ;
KOIDL, P .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1991, 6 (12C) :C71-C75
[8]  
GLOBUS TR, 1981, SOV PHYS JETP, V53, P5
[9]   MOLECULAR-BEAM EPITAXY OF PB1-XSRXSE FOR THE USE IN IR DEVICES [J].
LAMBRECHT, A ;
HERRES, N ;
SPANGER, B ;
KUHN, S ;
BOTTNER, H ;
TACKE, M ;
EVERS, J .
JOURNAL OF CRYSTAL GROWTH, 1991, 108 (1-2) :301-308
[10]   OPTICAL-PROPERTIES OF TERNARY AND QUATERNARY IV-VI SEMICONDUCTOR LAYERS ON (100) BAF2 SUBSTRATES [J].
MCCANN, PJ ;
LI, L ;
FURNEAUX, JE ;
WRIGHT, R .
APPLIED PHYSICS LETTERS, 1995, 66 (11) :1355-1357