Plasma immersion ion implantation for electronic materials

被引:26
作者
Jones, EC
Linder, BP
Cheung, NW
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 2B期
关键词
plasma immersion ion implantation; plasma doping; implantation; shallow junction; pn junction; SIMOX; polysilicon; trench; TFT; etching; dosimetry;
D O I
10.1143/JJAP.35.1027
中图分类号
O59 [应用物理学];
学科分类号
摘要
Plasma immersion ion implantation (PIII) is an emerging technology promising high dose-rate implantation and large-area processing compatibility. Innovations of this technique include: area-independent implantation time, concomitant deposition and implantation, and simple machine design and maintenance. This review summarizes the current understanding of PIII plasma dynamics, dosimetry, and electronic materials applications such as plasma doping for ultra-shallow junctions and high aspect ratio Si trenches, and subsurface synthesis of silicon-on-insulator materials.
引用
收藏
页码:1027 / 1036
页数:10
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