Plasma immersion ion implantation for electronic materials

被引:26
作者
Jones, EC
Linder, BP
Cheung, NW
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 2B期
关键词
plasma immersion ion implantation; plasma doping; implantation; shallow junction; pn junction; SIMOX; polysilicon; trench; TFT; etching; dosimetry;
D O I
10.1143/JJAP.35.1027
中图分类号
O59 [应用物理学];
学科分类号
摘要
Plasma immersion ion implantation (PIII) is an emerging technology promising high dose-rate implantation and large-area processing compatibility. Innovations of this technique include: area-independent implantation time, concomitant deposition and implantation, and simple machine design and maintenance. This review summarizes the current understanding of PIII plasma dynamics, dosimetry, and electronic materials applications such as plasma doping for ultra-shallow junctions and high aspect ratio Si trenches, and subsurface synthesis of silicon-on-insulator materials.
引用
收藏
页码:1027 / 1036
页数:10
相关论文
共 78 条
[41]  
LIU JP, IN PRESS
[42]  
LIU JR, IN PRESS APPL PHYS L
[43]  
LU NCC, 1989, IEEE CIRCUITS DE JAN, P27
[44]   BORON DOPING OF SILICON BY ARF EXCIMER LASER IRRADIATION IN B2H6 [J].
MATSUMOTO, S ;
YOSHIOKA, S ;
WADA, J ;
INUI, S ;
UWASAWA, K .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (12) :7204-7210
[45]   LOW-TEMPERATURE ACTIVATION OF IMPURITIES IMPLANTED BY ION DOPING TECHNIQUE FOR POLY-SI THIN-FILM TRANSISTORS [J].
MATSUO, M ;
NAKAZAWA, T ;
OHSHIMA, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (12B) :4567-4569
[46]   A 10-S DOPING TECHNOLOGY FOR THE APPLICATION OF LOW-TEMPERATURE POLYSILICON TFTS TO GIANT MICROELECTRONICS [J].
MIMURA, A ;
KAWACHI, G ;
AOYAMA, T ;
SUZUKI, T ;
NAGAE, Y ;
KONISHI, N ;
MOCHIZUKI, Y .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (03) :513-520
[47]   NON-MASS-SEPARATED ION SHOWER DOPING OF POLYCRYSTALLINE SILICON [J].
MISHIMA, Y ;
TAKEI, M .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (10) :4933-4938
[48]   NEW DOPING METHOD FOR SUBHALF MICRON TRENCH SIDEWALLS BY USING AN ELECTRON-CYCLOTRON RESONANCE PLASMA [J].
MIZUNO, B ;
NAKAYAMA, I ;
AOI, N ;
KUBOTA, M ;
KOMEDA, T .
APPLIED PHYSICS LETTERS, 1988, 53 (21) :2059-2061
[49]  
MIZUNO B, 1995, P ION IMPL TECH 1994, P985
[50]  
MIZUNO B, 1995, IN PRESS SURF COAT T