Doping-type dependence of turn-on delay time in 1.3-mu m InGaAsP-InP modulation-doped strained quantum-well lasers

被引:8
作者
Niwa, A
Ohtoshi, T
Uomi, K
Nakahara, K
机构
[1] Central Research Laboratory, Hitachi, Ltd., Kokubunji-shi, Tokyo 185, 1-280, Higashi-koigakubo
关键词
D O I
10.1109/68.481106
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The dependence of turn-on delay time on doping type in 1.3-mu m InGaAsP-InP modulation-doped (MD) strained quantum-well (QW) lasers is theoretically investigated, based on the detailed band structure model including the band mixing effects. It is found that the turn-on delay time in n-type MD lasers is reduced to 1/4 that of undoped lasers due to both a lower threshold current and a reduced carrier lifetime. The reduction of the delay time is smaller in p-type MD lasers, however, because of the increased threshold current, These results show that the n-type MD-QW lasers are superior for high-speed modulation under zero-bias conditions.
引用
收藏
页码:328 / 330
页数:3
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