From point to extended defects in two-dimensional MoS2: Evolution of atomic structure under electron irradiation

被引:454
作者
Komsa, Hannu-Pekka [1 ]
Kurasch, Simon [2 ]
Lehtinen, Ossi [2 ]
Kaiser, Ute [2 ]
Krasheninnikov, Arkady V. [1 ,3 ]
机构
[1] Univ Helsinki, Dept Phys, Helsinki 00014, Finland
[2] Univ Ulm, Grp Electron Microscopy Mat Sci, Cent Facil Electron Microscopy, D-89081 Ulm, Germany
[3] Aalto Univ, Dept Appl Phys, Aalto 00076, Finland
基金
芬兰科学院;
关键词
VALLEY POLARIZATION; BORON-NITRIDE; PHASE GROWTH; GRAPHENE; LAYERS; SEMICONDUCTORS; DISLOCATION; FABRICATION; NANOTUBES; SCALE;
D O I
10.1103/PhysRevB.88.035301
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
By combining high-resolution transmission electron microscopy experiments and first-principles calculations, we study production, diffusion, and agglomeration of sulfur vacancies in monolayer MoS2 under electron irradiation. Single vacancies are found to be mobile under the electron beam and tend to agglomerate into lines. Different kinds of such extended defects are identified in the experiments, and their atomic structures and electronic properties are determined with the help of calculations. The orientation of line defects is found to be sensitive to mechanical strain. Our calculations also indicate that the electronic properties of the extended defects can be tuned by filling vacancy lines with other atomic species, thereby suggesting a way for strain and electron-beam-assisted engineering of MoS2-based nanostructures .
引用
收藏
页数:8
相关论文
共 62 条
[31]   Atomic scale study of the life cycle of a dislocation in graphene from birth to annihilation [J].
Lehtinen, O. ;
Kurasch, S. ;
Krasheninnikov, A. V. ;
Kaiser, U. .
NATURE COMMUNICATIONS, 2013, 4
[32]   Fabrication of Single- and Multilayer MoS2 Film-Based Field-Effect Transistors for Sensing NO at Room Temperature [J].
Li, Hai ;
Yin, Zongyou ;
He, Qiyuan ;
Li, Hong ;
Huang, Xiao ;
Lu, Gang ;
Fam, Derrick Wen Hui ;
Tok, Alfred Iing Yoong ;
Zhang, Qing ;
Zhang, Hua .
SMALL, 2012, 8 (01) :63-67
[33]   Top-down fabrication of sub-nanometre semiconducting nanoribbons derived from molybdenum disulfide sheets [J].
Liu, Xiaofei ;
Xu, Tao ;
Wu, Xing ;
Zhang, Zhuhua ;
Yu, Jin ;
Qiu, Hao ;
Hong, Jin-Hua ;
Jin, Chuan-Hong ;
Li, Ji-Xue ;
Wang, Xin-Ran ;
Sun, Li-Tao ;
Guo, Wanlin .
NATURE COMMUNICATIONS, 2013, 4
[34]   Identification of active atomic defects in a monolayered tungsten disulphide nanoribbon [J].
Liu, Zheng ;
Suenaga, Kazu ;
Wang, Zhiyong ;
Shi, Zujin ;
Okunishi, Eiji ;
Iijima, Sumio .
NATURE COMMUNICATIONS, 2011, 2
[35]   Atomically Thin MoS2: A New Direct-Gap Semiconductor [J].
Mak, Kin Fai ;
Lee, Changgu ;
Hone, James ;
Shan, Jie ;
Heinz, Tony F. .
PHYSICAL REVIEW LETTERS, 2010, 105 (13)
[36]  
Mak KF, 2012, NAT NANOTECHNOL, V7, P494, DOI [10.1038/nnano.2012.96, 10.1038/NNANO.2012.96]
[37]   Magnetism in MoS2 induced by proton irradiation [J].
Mathew, S. ;
Gopinadhan, K. ;
Chan, T. K. ;
Yu, X. J. ;
Zhan, D. ;
Cao, L. ;
Rusydi, A. ;
Breese, M. B. H. ;
Dhar, S. ;
Shen, Z. X. ;
Venkatesan, T. ;
Thong, John T. L. .
APPLIED PHYSICS LETTERS, 2012, 101 (10)
[38]   Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene [J].
Meyer, Jannik C. ;
Eder, Franz ;
Kurasch, Simon ;
Skakalova, Viera ;
Kotakoski, Jani ;
Park, Hye Jin ;
Roth, Siegmar ;
Chuvilin, Andrey ;
Eyhusen, Soeren ;
Benner, Gerd ;
Krasheninnikov, Arkady V. ;
Kaiser, Ute .
PHYSICAL REVIEW LETTERS, 2012, 108 (19)
[39]   Selective Sputtering and Atomic Resolution Imaging of Atomically Thin Boron Nitride Membranes [J].
Meyer, Jannik C. ;
Chuvilin, Andrey ;
Algara-Siller, Gerardo ;
Biskupek, Johannes ;
Kaiser, Ute .
NANO LETTERS, 2009, 9 (07) :2683-2689
[40]   Electron irradiation-induced destruction of carbon nanotubes in electron microscopes [J].
Molhave, Kristian ;
Gudnason, Sven Bjarke ;
Pedersen, Anders Tegtmeier ;
Clausen, Casper Hyttel ;
Horsewell, Andy ;
Boggild, Peter .
ULTRAMICROSCOPY, 2007, 108 (01) :52-57