Low-frequency noise Behavior of SiO2-HfO2 dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness

被引:96
作者
Simoen, E
Mercha, A
Pantisano, L
Claeys, C
Young, E
机构
[1] IMEC, Int SEMATECH, ISMT, Philips Semicond, B-3001 Louvain, Belgium
[2] Katholieke Univ Leuven, Dept Elect Engn, B-3001 Louvain, Belgium
关键词
charge trapping; HfO2; high-kappa gate dielectric; low-frequency noise;
D O I
10.1109/TED.2004.826877
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The low-frequency noise has been studied in nMOSFETs with an HfO2-SiO2 gate stack, for different thickness of the SiO2 interfacial layer (IL). It is observed that the 1/ f -like noise in linear operation, is about 50 times higher in the HfO2 devices with a 0.8-nm chemical oxide IL, compared with the 4.5-nm thermal oxide reference n-channel transistors. This is shown to relate to the correspondingly higher trap density in the dielectric material. In addition, it is demonstrated that the noise rapidly reduces with increasing thickness of the IL. From the results for a 2.1-nm SiO2 IL, it is derived that at a certain gate voltage range, electron tunneling to a defect band in the HfO2 layer may contribute. to a pronounced increase in the flicker noise.
引用
收藏
页码:780 / 784
页数:5
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