Direct observation of the coexistence of coherent and incoherent InAs self-assembled dots by x-ray scattering

被引：19

作者：

Malachias, A

Magalhaes-Paniago, R

Neves, BRA

Rodrigues, WN

Moreira, MVB

Pfannes, HD

de Oliveira, AG

Kycia, S

Metzger, TH

机构：

[1] Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

[2] Lab Nacl Luz Sincrotron, BR-13084971 Campinas, SP, Brazil

[3] Univ Munich, Sekt Phys, D-80539 Munich, Germany

[4] Univ Munich, Ctr nano Sci, D-80539 Munich, Germany

[5] CETEC, Lab Nanscopia, BR-31170000 Belo Horizonte, MG, Brazil

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 26期

关键词：

D O I：

10.1063/1.1427421

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this letter, grazing incidence x-ray scattering is employed as a method to identify relaxed islands in an ensemble of partially coherent self-assembled InAs quantum dots. A simple model of strained pyramidal islands enables the association of the local lattice parameter of an island to its lateral size. A comparison between the island side length and its strain state allows the identification of coherent and incoherent nanostructures, revealing the size-strain interplay during growth. (C) 2001 American Institute of Physics.

引用

页码：4342 / 4344

页数：3

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