Microstructural analysis in epitaxial zirconia layers

被引：16

作者：

Boulle, A

Pradier, L

Masson, O

Guinebretière, R

Dauger, A

机构：

[1] ENSCI, UMR 6638, F-87065 Limoges, France

[2] Fac Sci, F-87060 Limoges, France

来源：

APPLIED SURFACE SCIENCE | 2002年 / 188卷 / 1-2期

关键词：

oxide layer; X-ray diffraction; epitaxy; sol-gel;

D O I：

10.1016/S0169-4332(01)00710-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Y2O3 stabilised ZrO2 (YSZ) layers were deposited on (11 (2) over bar0) Al2O3 by sol-gel dip-coating, A low temperature heat treatment produces a poly crystalline film. Further heating at 1500 degreesC yields an epitaxial layer by grain growth of the islands with the lowest interfacial energy. We used a home-made high resolution diffractometer to record reciprocal space maps of the YSZ layer. The simulation of the diffraction profiles with a kinematical scattering model enables us to extract the strain profile within the layer, the average thickness and the vertical island size distribution, (C) 2002 Elsevier Science B.V. All rights reserved.

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页码：80 / 84

页数：5

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