Influence of material growth and annealing conditions on recombination processes in low-temperature-grown GaAs

被引:14
作者
Loka, HS
Benjamin, SD
Smith, PWE
机构
[1] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
[2] Univ Toronto, Photon Res Ontario, Toronto, ON M5S 3G4, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
material growth; recombination processes; low-temperature-grown GaAs;
D O I
10.1016/S0030-4018(99)00059-0
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper we report direct measurements of the recombination times in low-temperature-grown GaAs (LT-GaAs). We investigate the effect of growth and annealing conditions on the recombination dynamics involving mid-gap and localized states. (C) 1999 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码:232 / 235
页数:4
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