SUBPICOSECOND CARRIER LIFETIME IN GAAS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES

被引:353
作者
GUPTA, S [1 ]
FRANKEL, MY [1 ]
VALDMANIS, JA [1 ]
WHITAKER, JF [1 ]
MOUROU, GA [1 ]
SMITH, FW [1 ]
CALAWA, AR [1 ]
机构
[1] MIT,LINCOLN LAB,LEXINGTON,MA 02173
关键词
D O I
10.1063/1.105729
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial GaAs grown by molecular beam epitaxy (MBE) at low substrate temperatures is observed to have a significantly shorter carrier lifetime than GaAs grown at normal substrate temperatures. Using femtosecond time-resolved-reflectance techniques, a subpicosecond (< 0.4 ps) carrier lifetime has been measured for GaAs grown by MBE at approximately 200-degrees-C and annealed at 600-degrees-C. With the same material as a photoconductive switch we have measured electrical pulses with a full-width at half-maximum of 0.6 ps using the technique of electro-optic sampling. Good responsivity for a photoconductive switch is observed, corresponding to a mobility of the photoexcited carriers of approximately 120-150 cm2/V s. GaAs grown by MBE at 200-degrees-C and annealed at 600-degrees-C is also semi-insulating, which results in a low dark current in the switch application. The combination of fast recombination lifetime, high carrier mobility, and high resistivity makes this material ideal for a number of subpicosecond photoconductive applications.
引用
收藏
页码:3276 / 3278
页数:3
相关论文
共 18 条
  • [1] Auston D, 1984, PICOSECOND OPTOELECT, P73, DOI [10.1016/B978-0-12-440880-7.50008-0, DOI 10.1016/B978-0-12-440880-7.50008-0]
  • [2] AMORPHOUS-SILICON PHOTODETECTOR FOR PICOSECOND PULSES
    AUSTON, DH
    LAVALLARD, P
    SOL, N
    KAPLAN, D
    [J]. APPLIED PHYSICS LETTERS, 1980, 36 (01) : 66 - 68
  • [3] CARRIER-INDUCED CHANGE IN REFRACTIVE-INDEX OF INP, GAAS, AND INGAASP
    BENNETT, BR
    SOREF, RA
    DELALAMO, JA
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1990, 26 (01) : 113 - 122
  • [4] MOBILITY-LIFETIME PRODUCTS IN HYDROGENATED AMORPHOUS-SILICON
    CRANDALL, RS
    BALBERG, I
    [J]. APPLIED PHYSICS LETTERS, 1991, 58 (05) : 508 - 510
  • [5] CARRIER LIFETIME VERSUS ION-IMPLANTATION DOSE IN SILICON ON SAPPHIRE
    DOANY, FE
    GRISCHKOWSKY, D
    CHI, CC
    [J]. APPLIED PHYSICS LETTERS, 1987, 50 (08) : 460 - 462
  • [6] SUBPICOSECOND PHOTORESPONSE OF CARRIERS IN LOW-TEMPERATURE MOLECULAR-BEAM EPITAXIAL IN0.52AL0.48AS/INP
    GUPTA, S
    BHATTACHARYA, PK
    PAMULAPATI, J
    MOUROU, G
    [J]. APPLIED PHYSICS LETTERS, 1990, 57 (15) : 1543 - 1545
  • [7] GUPTA S, 1990, ULTRAFAST PHENOMENA, V7, P297
  • [8] STOICHIOMETRY-RELATED DEFECTS IN GAAS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES
    KAMINSKA, M
    WEBER, ER
    LILIENTALWEBER, Z
    LEON, R
    REK, ZU
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (04): : 710 - 713
  • [9] SUBPICOSECOND CARRIER TRAPPING IN HIGH-DEFECT-DENSITY AMORPHOUS SI AND GAAS
    KUHL, J
    GOBEL, EO
    PFEIFFER, T
    JONIETZ, A
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1984, 34 (02): : 105 - 110
  • [10] HIGH-SPEED INP OPTOELECTRONIC SWITCH
    LEONBERGER, FJ
    MOULTON, PF
    [J]. APPLIED PHYSICS LETTERS, 1979, 35 (09) : 712 - 714