A versatile stable scanning proximal probe microscope

被引：15

作者：

Jahncke, CL ^{[1
]}

Hallen, HD ^{[1
]}

机构：

[1] N CAROLINA STATE UNIV,DEPT PHYS,RALEIGH,NC 27608

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1997年 / 68卷 / 04期

关键词：

D O I：

10.1063/1.1147988

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a novel scanning proximal probe microscope design utilizing a piezoelectric driven coarse positioning mechanism in x, y, and z, while maintaining relatively small lateral dimensions. The instrument is suitable for insertion into a Dewar. The primary purpose of this work is to develop a stable yet versatile instrument in order to meet the signal averaging limitations imposed by low signal level measurements. We have implemented a near field scanning optical microscope with this system, whose key features include simultaneous detection of reflected and transmitted signals, unique ''center of mass'' tip oscillator for shear force feedback, and overall microscope stability. (C) 1997 American Institute of Physics.

引用

收藏

页码：1759 / 1763

页数：5

相关论文

共 16 条

[1]

[Anonymous], 1993, SCANNING TUNNELING M

[2] COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].

BETZIG, E ;

FINN, PL ;

WEINER, JS .

APPLIED PHYSICS LETTERS, 1992, 60 (20) :2484-2486

[3] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[4] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[5] SCANNING HALL PROBE MICROSCOPY [J].

CHANG, AM ;

HALLEN, HD ;

HARRIOTT, L ;

HESS, HF ;

KAO, HL ;

KWO, J ;

MILLER, RE ;

WOLFE, R ;

VANDERZIEL, J ;

CHANG, TY .

APPLIED PHYSICS LETTERS, 1992, 61 (16) :1974-1976

[6] SCANNING HALL-PROBE MICROSCOPY OF A VORTEX AND FIELD FLUCTUATIONS IN LA1.85SR0.15CUO4 FILMS [J].

CHANG, AM ;

HALLEN, HD ;

HESS, HF ;

KAO, HL ;

KWO, J ;

SUDBO, A ;

CHANG, TY .

EUROPHYSICS LETTERS, 1992, 20 (07) :645-650

[7] INSITU STM IMAGING OF HIGH-TEMPERATURE OXYGEN ETCHING OF SI(111) (7X7) SURFACES [J].

FELTZ, A ;

MEMMERT, U ;

BEHM, RJ .

CHEMICAL PHYSICS LETTERS, 1992, 192 (2-3) :271-276

[8] DIRECT SPATIAL IMAGING OF VORTICES IN A SUPERCONDUCTING WIRE NETWORK [J].

HALLEN, HD ;

SESHADRI, R ;

CHANG, AM ;

MILLER, RE ;

PFEIFFER, LN ;

WEST, KW ;

MURRAY, CA ;

HESS, HF .

PHYSICAL REVIEW LETTERS, 1993, 71 (18) :3007-3010

[9] A NONOPTICAL TIP-SAMPLE DISTANCE CONTROL METHOD FOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY USING IMPEDANCE CHANGES IN AN ELECTROMECHANICAL SYSTEM [J].

HSU, JWP ;

LEE, M ;

DEAVER, BS .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (05) :3177-3181

[10] RAMAN IMAGING WITH NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].

JAHNCKE, CL ;

PAESLER, MA ;

HALLEN, HD .

APPLIED PHYSICS LETTERS, 1995, 67 (17) :2483-2485