Detection of picosecond electrical transients in a scanning tunneling microscope

被引：5

作者：

Groeneveld, RHM

Rasing, T

Kaufmann, LMF

Smalbrugge, E

Wolter, JH

Melloch, MR

vanKempen, H

机构：

[1] EINDHOVEN UNIV TECHNOL,COBRA,INTERUNIV RES INST,ELECTR DEVICES GRP,5600 MB EINDHOVEN,NETHERLANDS

[2] EINDHOVEN UNIV TECHNOL,COBRA,INTERUNIV RES INST,SEMICOND PHYS GRP,5600 MB EINDHOVEN,NETHERLANDS

[3] PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907

来源：

PHYSICA B | 1996年 / 218卷 / 1-4期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0921-4526(95)00618-4

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We have developed a scanning tunneling microscope using an optoelectronic switch which gates the tunneling tip current. The switch is fabricated within several tens of microns from the rip by photolithography and an accurate cleavage method. We demonstrate this approach by detecting picosecond electrical transients on a coplanar stripline. We have investigated the signal dependence on contact resistance and found significant differences when the tip is brought from low-ohmic contact into the tunneling regime.

引用

页码：294 / 296

页数：3

共 8 条

[1] PICOSECOND TIME-RESOLVED FAR-INFRARED EXPERIMENTS ON CARRIERS AND EXCITONS IN GAAS-ALGAAS MULTIPLE-QUANTUM WELLS [J].