Chemical vapor deposition of an electroplating Cu seed layer using hexafluoroacetylacetonate Cu(1,5-dimethylcyclooctadiene)

被引:15
作者
Lee, WH
Ko, YK
Byun, IJ
Seo, BS
Lee, JG
Reucroft, PJ
Lee, JU
Lee, JY
机构
[1] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
[2] Univ Kentucky, Dept Chem & Mat Engn, Lexington, KY 40506 USA
[3] Kookmin Univ, Sch Met & Mat Engn, Seoul 136702, South Korea
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 2001年 / 19卷 / 06期
关键词
D O I
10.1116/1.1405511
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Metal organic chemical vapor deposition (MOCVD) was used to obtain copper films with low resistivity, high reflectance, and good adhesion in the 500 Å to 700 Å thickness range. The effects of adding a He carrier gas system on the film characteristics were investigated. The deposition rate and the two dimensional layer-by-layer growth mode was enhanced by the addition of the carrier gas system.
引用
收藏
页码:2974 / 2978
页数:5
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