Fabrication and characterization of narrow-band Bragg-reflection filters in silicon-on-insulator ridge waveguides

被引：124

作者：

Murphy, TE ^{[1
]}

Hastings, JT

Smith, HI

机构：

[1] MIT, Lincoln Lab, Lexington, MA 02420 USA

[2] MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 2001年 / 19卷 / 12期

关键词：

Bragg scattering; gratings; optical planar waveguides; ridge waveguides; silicon-on-insulator (SOI) technology; waveguide components; waveguide filters;

D O I：

10.1109/50.971688

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We describe the design, fabrication and measurement of an integrated-optical Bragg grating filter, operating at a free-space wavelength of 1543 nm, based upon a silicon-on-insulator (SOI) ridge waveguide. The measured spectral response for a 4-mm long grating has a bandwidth of 15 GHz (0.12 nm), and shows good agreement with theoretical predictions.

引用

收藏

页码：1938 / 1942

页数：5

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