A study of high-frequency characteristics of write heads with the AC-Phase high-frequency magnetic force microscope

被引：27

作者：

Abe, M ^{[1
]}

Tanaka, Y ^{[1
]}

机构：

[1] Toshiba Co Ltd, Core Technol Ctr, Tokyo 1988710, Japan

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2002年 / 38卷 / 01期

关键词：

frequency characteristics; high-frequency measurement; magnetic force microscope; overwrite; write head;

D O I：

10.1109/TMAG.2002.988909

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We demonstrate frequency characteristic measurement methods of write head with an ac-phase high-frequency magnetic force microscope (HT-MFM). Two measurement methods allow separating the characteristics into electric ones including the head amplifier and/or interconnects and magnetic ones including head materials. The high spatial resolution ac-phase BF-MFM allows resolving the distribution change of the HF magnetic field with frequency. The relation between HF-MFM and spin-stand data was also investigated. It is thought that BF-MFM measurements can be applied to head performance test before HDD manufacturing.

引用

页码：45 / 49

页数：5

共 10 条

[1] High frequency write head measurement with the phase detection magnetic force microscope [J].