Reversible metal-semiconductor transitions for microwave switching applications - art. no. 073503

被引:36
作者
Dragoman, M
Cismaru, A
Hartnagel, H
Plana, R
机构
[1] CNRS, LAAS, F-31077 Toulouse 4, France
[2] Natl Res & Dev Inst Microtechnol, Bucharest 077190, Romania
[3] Tech Univ Darmstadt, Inst Hochfrequenztech, D-64283 Darmstadt, Germany
关键词
D O I
10.1063/1.2177369
中图分类号
O59 [应用物理学];
学科分类号
摘要
This letter presents an original approach regarding the switching at high frequencies using reversible metal-semiconductor transitions displayed by various materials termed as Mott materials. The Mott materials experience a reversible semiconductor-metal transition when an external parameter (temperature, dc bias, hydrogenation, etc.) is varied. This transition can be used to allow or to stop the propagation of high-frequency fields, when a thin film of a Mott material is integrated with a planar high-frequency waveguide. This effect could have important applications in the area of communications, computing, and sensors.
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页数:3
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共 18 条
[1]   RF-MEMS switches for reconfigurable integrated circuits [J].
Brown, ER .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1998, 46 (11) :1868-1880
[2]   Evidence for a structurally-driven insulator-to-metal transition in VO2:: A view from the ultrafast timescale -: art. no. 161102 [J].
Cavalleri, A ;
Dekorsy, T ;
Chong, HHW ;
Kieffer, JC ;
Schoenlein, RW .
PHYSICAL REVIEW B, 2004, 70 (16) :1-4
[3]   Optical switch based on vanadium dioxide thin films [J].
Chen, SH ;
Ma, H ;
Yi, XJ ;
Wang, HC ;
Tao, X ;
Chen, MX ;
Li, XW ;
Ke, CJ .
INFRARED PHYSICS & TECHNOLOGY, 2004, 45 (04) :239-242
[4]   Properties and applications of high-mobility semiconducting nanotubes [J].
Dürkop, T ;
Kim, BM ;
Fuhrer, MS .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2004, 16 (18) :R553-R580
[5]   THIN-FILM VO2 SUBMILLIMETER-WAVE MODULATORS AND POLARIZERS [J].
FAN, JCC ;
FETTERMAN, HR ;
BACHNER, FJ ;
ZAVRACKY, PM ;
PARKER, CD .
APPLIED PHYSICS LETTERS, 1977, 31 (01) :11-13
[6]   The effect of applied strain on the resistance of VO2 thin films [J].
Gregg, JM ;
Bowman, RM .
APPLIED PHYSICS LETTERS, 1997, 71 (25) :3649-3651
[7]   MILLIMETER-WAVE DIELECTRIC-PROPERTIES OF EPITAXIAL VANADIUM DIOXIDE THIN-FILMS [J].
HOOD, PJ ;
DENATALE, JF .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (01) :376-381
[8]   Design, fabrication and testing of a micromachined thermo-optical light modulator based on a vanadium dioxide array [J].
Jiang, L ;
Carr, WN .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2004, 14 (07) :833-840
[9]   Mechanism and observation of Mott transition in VO2-based two- and three-terminal devices -: art. no. 052 [J].
Kim, HT ;
Chae, BG ;
Youn, DH ;
Maeng, SL ;
Kim, G ;
Kang, KY ;
Lim, YS .
NEW JOURNAL OF PHYSICS, 2004, 6
[10]   Electronic response and bandstructure modulation of carbon nanotubes in a transverse electrical field [J].
Li, Y ;
Rotkin, SV ;
Ravaioli, U .
NANO LETTERS, 2003, 3 (02) :183-187