Analysis of step-stress accelerated-life-test data: A new approach

被引：49

作者：

Tang, LC ^{[1
]}

Sun, YS ^{[1
]}

Goh, TN ^{[1
]}

Ong, HL ^{[1
]}

机构：

[1] SILICON SYST SINGAPORE PFC LTD, SINGAPORE, SINGAPORE

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1996年 / 45卷 / 01期

关键词：

Weibull distribution; cumulative exposure model; accelerated life test; step-stress; maximum likelihood estimator (MLE);

D O I：

10.1109/24.488919

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A linear cumulative exposure model (LCEM) is used to analyze data from a step-stress accelerated-life-test, in particular, those with failure-free life (FFL). FFL is characterized by a location parameter in the distribution. For the 2-parameter Weibull distribution, the Nelson cumulative exposure model is a special case of LCEM. Under LCEM a general expression is derived for computing the MLE of stress-dependent distribution parameters under multiple censoring. The estimation procedure is simple and is illustrated by a set of experimental data using the 3-parameter Weibull distribution.

引用

页码：69 / 74

页数：6

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