Instrumental profile of MYTHEN detector in Debye-Scherrer geometry

被引：27

作者：

Gozzo, Fabia ^{[1
]}

Cervellino, Antonio ^{[1
]}

Leoni, Matteo ^{[2
]}

Scardi, Paolo ^{[2
]}

Bergamaschi, Anna ^{[1
]}

Schmitt, Bernd ^{[1
]}

机构：

[1] Paul Scherrer Inst, Swiss Light Source, Villigen, Switzerland

[2] Univ Trento, Dept Mat Engn & Ind Technol, Trento, Italy

来源：

ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS | 2010年 / 225卷 / 12期

关键词：

Instrumental line profile; Profile aberrations; Synchrotron radiation XRPD; Debye-Scherrer geometry; Position sensitive detector; MYTHEN; TOPAS; PM2K; WPPM; SWISS LIGHT-SOURCE; POWDER DIFFRACTION EXPERIMENTS; COUNTING MICROSTRIP DETECTOR; MATERIALS SCIENCE BEAMLINE; LINE-BROADENING ANALYSIS; AXIAL DIVERGENCE; PATTERN; DIFFRACTOMETER; REFINEMENT; REALIZATION;

D O I：

10.1524/zkri.2010.1345

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The main aberrations affecting data collected with ID position sensitive detectors in Debye-Scherrer capillary geometry are examined, and analytical corrections proposed. The equations are implemented in two of the most advanced software based on the Rietveld and Whole Powder Pattern Modelling methods, respectively, for structure and microstructure analysis. Application to MYTHEN, a fast single photon counting detector developed at the Swiss Light Source, is discussed in detail.

引用

页码：616 / 624

页数：9

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