Concentration-Dependent Hole Mobility and Recombination Coefficient in Bulk Heterojunctions Determined from Transient Absorption Spectroscopy

被引:45
作者
Eng, Mattias P. [1 ,2 ]
Barnes, Piers R. F. [1 ]
Durrant, James R. [1 ]
机构
[1] Univ London Imperial Coll Sci Technol & Med, Dept Chem, London SW7 2AZ, England
[2] Chalmers, Dept Phys, S-41296 Gothenburg, Sweden
来源
JOURNAL OF PHYSICAL CHEMISTRY LETTERS | 2010年 / 1卷 / 20期
基金
英国工程与自然科学研究理事会;
关键词
FIELD-EFFECT TRANSISTORS; SENSITIZED SOLAR-CELLS; CHARGE-TRANSPORT; POLY(3-HEXYLTHIOPHENE); DIFFUSION; TRAPS;
D O I
10.1021/jz1011803
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A simple analytical function based on the multiple trapping model, is used to describe the biomolecular recombination of charge carriers in a bulk heterojunction (BHJ) film in the presence of an exponential energetic tail of localized hole "trap" states. The function is used to fit charge carrier decay data from an unannealed P3HT/PCBM film measured by transient absorption. The analysis assumes that only free holes participate in recombination and transport. This implies an effective recombination rate coefficient which varies with the ratio of free to trapped holes. The fit parameters yield a bimolecular recombination constant for free holes with free electrons (k(o) = 3.4 x 10(-12) cm(3) s(-1)) and information about the distribution of trap states (trap distribution parameter beta = 0.29) Assuming the Langevin recombination limit, the analysis yields a concentration dependent effective hole mobility saturating at mu(o) approximate to 7 x 10(-2) cm(2) V-1 s(-1). This approach should be useful to compare BHJs in a consistent and meaningful manner.
引用
收藏
页码:3096 / 3100
页数:5
相关论文
共 37 条
[11]   Polaron recombination in pristine and annealed bulk heterojunction solar cells [J].
Deibel, C. ;
Baumann, A. ;
Dyakonov, V. .
APPLIED PHYSICS LETTERS, 2008, 93 (16)
[12]   Electrodeless time-resolved microwave conductivity study of charge-carrier photogeneration in regioregular poly(3-hexylthiophene) thin films [J].
Dicker, G ;
de Haas, MP ;
Siebbeles, LDA ;
Warman, JM .
PHYSICAL REVIEW B, 2004, 70 (04) :045203-1
[13]   Simultaneous determination of carrier lifetime and electron density-of-states in P3HT:PCBM organic solar cells under illumination by impedance spectroscopy [J].
Garcia-Belmonte, Germa ;
Boix, Pablo P. ;
Bisquert, Juan ;
Sessolo, Michele ;
Bolink, Henk J. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2010, 94 (02) :366-375
[14]   Separation of fast and slow transport in regiorandom poly(3-hexylthiophene) [J].
Genevicius, K ;
Österbacka, R ;
Juska, G ;
Arlauskas, K ;
Stubb, H .
SYNTHETIC METALS, 2003, 137 (1-3) :1407-1408
[15]   Recombination in Annealed and Nonannealed Polythiophene/Fullerene Solar Cells: Transient Photovoltage Studies versus Numerical Modeling [J].
Hamilton, Rick ;
Shuttle, Christopher G. ;
O'Regan, Brian ;
Hammant, Thomas C. ;
Nelson, Jenny ;
Durrant, James R. .
JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2010, 1 (09) :1432-1436
[16]  
HOROWITZ G, 1995, J PHYS III, V5, P355, DOI 10.1051/jp3:1995132
[17]   Frequency analysis on poly(3-hexylthiopene) rectifier using impedance spectroscopy [J].
Kang, Chan-mo ;
Kim, Seohee ;
Hong, Yongtaek ;
Lee, Changhee .
THIN SOLID FILMS, 2009, 518 (02) :889-892
[18]   Electron Diffusion Length in Mesoporous Nanocrystalline TiO2 Photoelectrodes during Water Oxidation [J].
Leng, W. H. ;
Barnes, Piers R. F. ;
Juozapavicius, Mindaugas ;
O'Regan, Brian C. ;
Durrant, James R. .
JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2010, 1 (06) :967-972
[19]   Infrared imaging of the nanometer-thick accumulation layer in organic field-effect transistors [J].
Li, ZQ ;
Wang, GM ;
Sai, N ;
Moses, D ;
Martin, MC ;
Di Ventra, M ;
Heeger, AJ ;
Basov, DN .
NANO LETTERS, 2006, 6 (02) :224-228
[20]   Concentration-dependent mobility in organic field-effect transistors probed by infrared spectromicroscopy of the charge density profile [J].
Meyertholen, A. D. ;
Li, Z. Q. ;
Basov, Dimitri N. ;
Fogler, M. M. ;
Martin, M. C. ;
Wang, G. M. ;
Dhoot, A. S. ;
Moses, D. ;
Heeger, A. J. .
APPLIED PHYSICS LETTERS, 2007, 90 (22)