Transport properties of V-VI semiconducting thermoelectric BiSbTe alloy thin films and their application to micromodule Peltier devices

被引:82
作者
Boulouz, A
Chakraborty, S
Giani, A
Delannoy, FP
Boyer, A
Schumann, J
机构
[1] Univ Montpellier 2, Ctr Elect & Microoptoelect Montpellier, F-34095 Montpellier 05, France
[2] Inst Solid State & Mat Res, Thin Film & Nanostruct Dept, D-01069 Dresden, Germany
关键词
D O I
10.1063/1.1360701
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thin semiconducting thermoelectric films with narrow energy band gaps are considered to be very promising for future microdevice applications (sensors and generators). The polycrystalline BiSbTe alloys (V-VI semiconductors) are examples. In this report, the detailed temperature dependence of electrical resistivity [rho (T)], n- and p-type carrier concentration [n(T) and p(T)], and Hall mobility [mu (T)] of n-type Bi2Te3, p-type Sb2Te3, and p-type (Bi1-xSbx)(2)Te-3 (x=0.73 and 0.77) alloy films prepared by metalorganic chemical vapor deposition are presented in the range of 100-500 K. From the room temperature measurement of the Seebeck coefficient (alpha), the values of alpha for Bi2Te3, Sb2Te3, and (Bi1-xSbx)(2)Te-3 with x=0.73 and 0.77 are found to be -220, +110, +240, and +210 muV/K, respectively, which are optimal in these types of film materials. The carrier concentration of these films at 300 K is found to be around (10(19)-10(20)) cm(-3). The rho (T) data show an exponential increase with increasing temperature irrespective of the carrier types. For the temperature dependence of the Hall mobility, the lattice contribution is found to be predominant for all the films. Also, we have fabricated a simple micromodule Peltier device (MMP) using the n-type Bi2Te3 and the p-type (Bi1-xSbx)(2)Te-3 (x=0.77) films where a maximum cooling of 2.6 degreesC was obtained with a low input current of 2.5 mA. (C) 2001 American Institute of Physics.
引用
收藏
页码:5009 / 5014
页数:6
相关论文
共 30 条
[1]   Preparation and characterization of MOCVD bismuth telluride thin films [J].
Boulouz, A ;
Giani, A ;
Pascal-Delannoy, F ;
Boulouz, M ;
Foucaran, A ;
Boyer, A .
JOURNAL OF CRYSTAL GROWTH, 1998, 194 (3-4) :336-341
[2]  
BOULOUZ A, 1999, THESIS U MONTPELLIER
[3]   PROPERTIES OF THIN-FILM THERMOELECTRIC-MATERIALS - APPLICATION TO SENSORS USING THE SEEBECK EFFECT [J].
BOYER, A ;
CISSE, E .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1992, 13 (02) :103-111
[4]   Antisite defects of Bi2Te3 thin films [J].
Cho, SL ;
Kim, Y ;
DiVenere, A ;
Wong, GK ;
Ketterson, JB ;
Meyer, JR .
APPLIED PHYSICS LETTERS, 1999, 75 (10) :1401-1403
[5]   Anisotropic Seebeck and magneto-Seebeck coefficients of Bi and Bi0.92Sb0.08 alloy thin films [J].
Cho, SL ;
Kim, Y ;
DiVenere, A ;
Wong, GKL ;
Ketterson, JB ;
Meyer, JR .
JOURNAL OF APPLIED PHYSICS, 2000, 88 (02) :808-812
[6]  
DUBOIS LH, 1999, P 18 INT C THERM IEE, P1
[7]   Comparative studies between the growth characteristics of Bi2Te3 thin films deposited on SiO2, Si(100) and Si(111) [J].
Ferhat, M ;
Liautard, B ;
Brun, G ;
Tedenac, JC ;
Nouaoura, M ;
Lassabatere, L .
JOURNAL OF CRYSTAL GROWTH, 1996, 167 (1-2) :122-128
[8]  
Fleurial J.P., 1999, INT C THERM ICT P, V294
[9]   Low thermal conductivity skutterudites [J].
Fleurial, JP ;
Caillat, T ;
Borshchevsky, A .
THERMOELECTRIC MATERIALS - NEW DIRECTIONS AND APPROACHES, 1997, 478 :175-186
[10]  
FOUCARAN A, 1997, P 16 INT C THERM DRE, P301