Fabrication of elliptically figured mirror for focusing hard x rays to size less than 50 nm

被引:35
作者
Yumoto, H
Mimura, H
Matsuyama, S
Hara, H
Yamamura, K
Sano, Y
Ueno, K
Endo, K
Mori, Y
Yabashi, M
Nishino, Y
Tamasaku, K
Ishikawa, T
Yamauchi, K
机构
[1] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, Suita, Osaka 5650871, Japan
[2] Osaka Univ, Grad Sch Engn, Res Ctr Ultra Precis Sci & Technol, Suita, Osaka 5650871, Japan
[3] JASRI, SPring 8, Mikazuki, Hyogo 6795148, Japan
关键词
D O I
10.1063/1.1922827
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In this study, we designed, fabricated, and evaluated a hard x-ray focusing mirror having an ideally focused beam with a full width at half maximum in the intensity profile of 36 nm at an x-ray energy of 15 keV. The designed elliptically curved shape was fabricated by a computer-controlled fabrication system using plasma chemical vaporization machining and elastic emission machining, on the basis of surface profiles accurately measured by combining microstitching interferometry with relative angle determinable stitching interferometry. A platinum-coated surface was employed for hard x-ray focusing with a large numerical aperture. Line-focusing tests on the fabricated elliptical mirror are carried out at the 1-km-long beamline of SPring-8. A full width at half maximum of 40 nm was achieved in the focused beam intensity profile under the best focus conditions. (c) 2005 American Institute of Physics.
引用
收藏
页数:5
相关论文
共 15 条
[1]   High-efficiency multilevel zone plates for keV X-rays [J].
Di Fabrizio, E ;
Romanato, F ;
Gentili, M ;
Cabrini, S ;
Kaulich, B ;
Susini, J ;
Barrett, R .
NATURE, 1999, 401 (6756) :895-898
[2]   Submicron focusing of hard X-rays with reflecting surfaces at the ESRF [J].
Hignette, O ;
Rostaing, G ;
Cloetens, P ;
Rommeveaux, A ;
Ludwig, W ;
Freund, A .
X-RAY MICRO- AND NANO-FOCUSING: APPLICATIONS AND TECHNIQUES II, 2001, 4499 :105-116
[3]   Elliptical x-ray microprobe mirrors by differential deposition [J].
Ice, GE ;
Chung, JS ;
Tischler, JZ ;
Lunt, A ;
Assoufid, L .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (07) :2635-2639
[4]   Wave-optical and ray-tracing analysis to establish a compact two-dimensional focusing unit using K-B mirror arrangement [J].
Matsuyama, S ;
Mimura, H ;
Yamamura, K ;
Yumoto, H ;
Sano, Y ;
Endo, K ;
Mori, Y ;
Yabashi, M ;
Tamasaku, K ;
Nishino, Y ;
Ishikawa, T ;
Yamauchi, K .
ADVANCES IN MIRROR TECHNOLOGY FOR X-RAY, EUV LITHOGRAPHY, LASER, AND OTHER APPLICATIONS II, 2004, 5533 :181-191
[5]   Relative angle determinable stitching interferometry for hard x-ray reflective optics [J].
Mimura, H ;
Yumoto, H ;
Matsuyama, S ;
Yamamura, K ;
Sano, Y ;
Ueno, K ;
Endo, K ;
Mori, Y ;
Yabashi, M ;
Tamasaku, K ;
Nishino, Y ;
Ishikawa, T ;
Yamauchi, K .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (04)
[6]   Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics [J].
Mimura, H ;
Yamauchi, K ;
Yamamura, K ;
Kubota, A ;
Matsuyama, S ;
Sano, Y ;
Ueno, K ;
Endo, K ;
Nishino, Y ;
Tamasaku, K ;
Yabashi, M ;
Ishikawa, T ;
Mori, Y .
JOURNAL OF SYNCHROTRON RADIATION, 2004, 11 :343-346
[7]  
MORI Y, 2003, P SOC PHOTO-OPT INS, V5193, P11
[8]   Nanofocusing parabolic refractive x-ray lenses [J].
Schroer, CG ;
Kuhlmann, M ;
Hunger, UT ;
Günzler, TF ;
Kurapova, O ;
Feste, S ;
Frehse, F ;
Lengeler, B ;
Drakopoulos, M ;
Somogyi, A ;
Simionovici, AS ;
Snigirev, A ;
Snigireva, I ;
Schug, C ;
Schröder, WH .
APPLIED PHYSICS LETTERS, 2003, 82 (09) :1485-1487
[9]   SPring-8 RIKEN beamline III for coherent X-ray optics [J].
Tamasaku, K ;
Tanaka, Y ;
Yabashi, M ;
Yamazaki, H ;
Kawamura, N ;
Suzuki, M ;
Ishikawa, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 467 :686-689
[10]   Fabrication of elliptical mirror at nanometer-level accuracy for hard x-ray focusing by numerically controlled plasma chemical vaporization machining [J].
Yamamura, K ;
Yamauchi, K ;
Mimura, H ;
Sano, Y ;
Saito, A ;
Endo, K ;
Souvorov, A ;
Yabashi, M ;
Tamasaku, K ;
Ishikawa, T ;
Mori, Y .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (10) :4549-4553