Atomic Force Microscope techniques for adhesion measurements

被引：18

作者：

Schaefer, DM ^{[1
]}

Gomez, J

机构：

[1] Towson Univ, Dept Phys Astron & Geosci, Towson, MD 21252 USA

[2] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain

来源：

JOURNAL OF ADHESION | 2000年 / 74卷 / 1-4期

关键词：

adhesion maps; atomic force microscopy; force curves; jump mode;

D O I：

10.1080/00218460008034535

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

The Atomic Force Microscope (AFM) has become a powerful apparatus for performing real-time, quantitative force measurements between materials. Recently the AFM has been used to measure adhesive interactions between probes placed on the AFM cantilever and sample surfaces. This article reviews progress in this area of adhesion measurement, and describes a new technique (Jump Mode) for obtaining adhesion maps of surfaces. Jump mode has the advantage of producing fast. quantitative adhesion maps with minimal memory usage.

引用

页码：341 / +

页数：22

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