Universal interface width distributions at the depinning threshold

被引:43
作者
Rosso, A
Krauth, W
Doussal, PL
Vannimenus, J
Wiese, KJ
机构
[1] Ecole Normale Super, CNRS, Lab Phys Stat, F-75231 Paris, France
[2] Ecole Normale Super, CNRS, Phys Theor Lab, F-75231 Paris, France
[3] Univ Calif Santa Barbara, KITP, Santa Barbara, CA 93106 USA
来源
PHYSICAL REVIEW E | 2003年 / 68卷 / 03期
关键词
D O I
10.1103/PhysRevE.68.036128
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
We compute the probability distribution of the interface width at the depinning threshold, using recent powerful algorithms. It confirms the universality classes found previously. In all cases, the distribution is surprisingly well approximated by a generalized Gaussian theory of independent modes which decay with a characteristic propagator G(q)=1/q(d+2zeta); zeta, the roughness exponent, is computed independently. A functional renormalization analysis explains this result and allows one to compute the small deviations, i.e., a universal kurtosis ratio, in agreement with numerics. We stress the importance of the Gaussian theory to interpret numerical data and experiments.
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页数:4
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