Arsenic surfactant effects and arsenic mediated molecular beam epitaxial growth dot cubic GaN

被引:55
作者
Okumura, H
Hamaguchi, H
Feuillet, G
Ishida, Y
Yoshida, S
机构
[1] Electrotech Lab, Tsukuba, Ibaraki 305, Japan
[2] Sci Univ Tokyo, Noda, Chiba 278, Japan
[3] CEA, Ctr Grenoble, F-38041 Grenoble, France
关键词
D O I
10.1063/1.121539
中图分类号
O59 [应用物理学];
学科分类号
摘要
Small amounts of As residual pressure were found to affect the structure of cubic GaN growing surfaces in molecular beam epitaxy growth, i.e., modification of surface reconstruction structures, stabilization of reconstructed flat surfaces at high substrate temperatures, and preferential growth of the cubic phase. These As surfactant effects are discussed in relation to the atomic arrangement of the As-passivated surface of GaN. It was shown that the quality of cubic GaN epilayers can be improved by utilizing a small amount of As residual pressure. (C) 1998 American Institute of Physics. [S0003-6951(98)03223-9].
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页码:3056 / 3058
页数:3
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