High-spatial-resolution surface-temperature mapping using fluorescent thermometry

被引：167

作者：

Loew, Peter ^{[1
,2
]}

Kim, Beomjoon ^{[2
]}

Takama, Nobuyuki ^{[2
]}

Bergaud, Christian ^{[1
]}

机构：

[1] Univ Toulouse, CNRS, LAAS, Nanobiosyst Grp, F-31077 Toulouse 4, France

[2] Univ Tokyo, Inst Ind Sci, CNRS, LIMMS,Meguro Ku, Tokyo, Japan

来源：

SMALL | 2008年 / 4卷 / 07期

关键词：

fluorescence; nanowires; resistive heating; thermometry;

D O I：

10.1002/smll.200700581

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A study was conducted to determine high-spatial-resolution submicrometer surface-temperature mapping using fluorescent thermometry. The study compared the experimental results with a finite element (FE) model implemented in the COMSOL software. The fluorescent thermometry is used to determine the temperature at the location of fluorophore by analyzing the temperature- dependent fluorescence from a fluorophore. The study used Rhodamine B fluorophore and fluorescent thermometry to determine the temperature on micrometer and submicrometer scales. The study implemented a FE model to simulate the resistive heating in a microwave. Micro- and nanostructures placed on top of a thermally oxidized silicon wafer in this study. The study performed thermal cycles and temperature calibration using a microscope heating stage.

引用

页码：908 / 914

页数：7

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