Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy -: art. no. 213114

被引：30

作者：

Zdrojek, M

Mélin, T

Boyaval, C

Stiévenard, D

Jouault, B

Wozniak, M

Huczko, A

Gebicki, W

Adamowicz, L

机构：

[1] CNRS, UMR 8520, Inst Electron & Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France

[2] Warsaw Univ Technol, Fac Phys, PL-00662 Warsaw, Poland

[3] Inst Electron & Microelect & Nanotechnol, CNRS, UMR 8520, F-59652 Villeneuve Dascq, France

[4] Univ Montpellier 2, CNRS, UMR 5650, Etud Semicond Grp, F-34095 Montpellier, France

[5] Warsaw Univ Technol, Fac Mat Sci & Engn, PL-02507 Warsaw, Poland

[6] Univ Warsaw, Fac Chem, PL-02093 Warsaw, Poland

[7] Warsaw Univ Technol, Fac Phys, PL-00662 Warsaw, Poland

来源：

APPLIED PHYSICS LETTERS | 2005年 / 86卷 / 21期

关键词：

D O I：

10.1063/1.1925782

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Electrostatic properties of single-separated multiwalled carbon nanotubes (MWCNTs) deposited on a dielectric layer have been investigated by charge injection and electric force microscopy (EFM) experiments. We found that upon local injection from the biased EFM tip, charges delocalize over the whole nanotube length (i.e., 1-10 mu m), consistent with a capacitive charging of the MWCNT-substrate capacitance. In addition, the insulating layer supporting the nanotubes is shown to act as a charge-sensitive plate for electrons emitted from the MWCNTs at low electric fields, thus allowing the spatial mapping of MWCNT field-emission patterns. (c) 2005 American Institute of Physics.

引用

页码：1 / 3

页数：3

共 17 条

[11] Probing nanoscale dipole-dipole interactions by electric force microscopy -: art. no. 166101 [J].