Interpretation of contrast in tapping mode AFM and shear force microscopy. A study of nafion

被引:180
作者
James, PJ [1 ]
Antognozzi, M [1 ]
Tamayo, J [1 ]
McMaster, TJ [1 ]
Newton, JM [1 ]
Miles, MJ [1 ]
机构
[1] Univ Bristol, HH Wills Phys Lab, Bristol BS8 1TL, Avon, England
关键词
D O I
10.1021/la000332h
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The origin of phase contrast in tapping-mode atomic force microscopy has been investigated using two complementary scanning probe microscopy techniques, atomic force microscopy and shear force microscopy, which can be classified as a transverse dynamic force microscopy. The sample chosen for this study was Nafion, and specifically the membrane in different hydration states by virtue of its cation form. Differences in probe-sample adhesion throughout a sample, caused by an inhomogeneous distribution of surface water, were an important phase-contrast mechanism. A new variant in three-dimensional force imaging, phase-volume imaging has been a useful tool in the interpretation of phase contrast. With the use of transverse dynamic force microscopy, approach curves were obtained while the frequency spectrum around resonance was measured. This enabled the damping of the probe oscillation amplitude and the shift in its resonant frequency to be decoupled. Knowing the true oscillation amplitude of the probe, it was also possible to determine quantitatively the elastic and dissipative parts of the probe-sample interaction. Distinct regimes were found at different probe-sample separations.
引用
收藏
页码:349 / 360
页数:12
相关论文
共 63 条
[1]   Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects [J].
Anczykowski, B ;
Kruger, D ;
Fuchs, H .
PHYSICAL REVIEW B, 1996, 53 (23) :15485-15488
[2]   Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation [J].
Anczykowski, B ;
Kruger, D ;
Babcock, KL ;
Fuchs, H .
ULTRAMICROSCOPY, 1996, 66 (3-4) :251-259
[3]  
ANTOGNOZZI M, 2000, IN PRESS REV SCI INS
[4]   Effect of tip sharpness on the relative contributions of attractive and repulsive forces in the phase imaging of tapping mode atomic force microscopy [J].
Bar, G ;
Brandsch, R ;
Whangbo, MH .
SURFACE SCIENCE, 1999, 422 (1-3) :L192-L199
[5]   Examination of the relationship between phase shift and energy dissipation in tapping mode atomic force microscopy by frequency-sweep and force-probe measurements [J].
Bar, G ;
Brandsch, R ;
Bruch, M ;
Delineau, L ;
Whangbo, MH .
SURFACE SCIENCE, 2000, 444 (1-3) :L11-L16
[6]   Description of the frequency dependence of the amplitude and phase angle of a silicon cantilever tapping on a silicon substrate by the harmonic approximation [J].
Bar, G ;
Brandsch, R ;
Whangbo, MH .
SURFACE SCIENCE, 1998, 411 (1-2) :L802-L809
[7]   Correlation between frequency-sweep hysteresis and phase imaging instability in tapping mode atomic force microscopy [J].
Bar, G ;
Brandsch, R ;
Whangbo, MH .
SURFACE SCIENCE, 1999, 436 (1-3) :L715-L723
[8]  
Beake BD, 1999, SURF INTERFACE ANAL, V27, P1084, DOI 10.1002/(SICI)1096-9918(199912)27:12<1084::AID-SIA680>3.0.CO
[9]  
2-6
[10]   Phase imaging: Deep or superficial? [J].
Behrend, OP ;
Odoni, L ;
Loubet, JL ;
Burnham, NA .
APPLIED PHYSICS LETTERS, 1999, 75 (17) :2551-2553