Study of nonlinear optical effects in GaN:Mg epitaxial film

被引:62
作者
Zhang, HY [1 ]
He, XH [1 ]
Shih, YH [1 ]
Schurman, M [1 ]
Feng, ZC [1 ]
Stall, RA [1 ]
机构
[1] EMCORE CORP, SOMERSET, NJ 08873 USA
关键词
D O I
10.1063/1.117741
中图分类号
O59 [应用物理学];
学科分类号
摘要
The second-order nonlinear optical coefficients d(33), d(31), and d(15) of GaN:Mg epitaxial film were studied by the standard Maker fringe of an anisotropic medium. The measured d(33)=-(16.5+/-1.3) pm/V which is 55 times of the d(11) of quartz. The measured ratios of d(33)/d(31) and d(31)/d(15) showed that the crystalline film is close to an ideal wurzite structure. The refractive indices and the dispersive curves of n(e), n(0) were also determined by TM and TE waveguide mode measurements. (C) 1996 American Institute of Physics.
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页码:2953 / 2955
页数:3
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