Revealing Buried Interfaces to Understand the Origins of Threshold Voltage Shifts in Organic Field-Effect Transistors

被引：107

作者：

Mathijssen, Simon G. J. ^{[1
,2
]}

Spijkman, Mark-Jan ^{[1
,3
]}

Andringa, Anne-Marije ^{[1
,3
]}

van Hal, Paul A. ^{[1
]}

McCulloch, Iain ^{[4
]}

Kemerink, Martijn ^{[2
]}

Janssen, Rene A. J. ^{[2
]}

de Leeuw, Dago M. ^{[1
,3
]}

机构：

[1] Philips Res Labs, NL-5656 AE Eindhoven, Netherlands

[2] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands

[3] Univ Groningen, Zernike Inst Adv Mat, NL-9747 AG Groningen, Netherlands

[4] Univ London Imperial Coll Sci Technol & Med, Dept Chem, London SW7 2AZ, England

来源：

ADVANCED MATERIALS | 2010年 / 22卷 / 45期

关键词：

THIN-FILM-TRANSISTORS; PROBE FORCE MICROSCOPY;

D O I：

10.1002/adma.201001865

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The semiconductor of an organic field-effect transistor is stripped with adhesive tape, yielding an exposed gate dielectric, accessible for various characterization techniques. By using scanning Kelvin probe microscopy we reveal that trapped charges after gate bias stress are located at the gate dielectric and not in the semiconductor. Charging of the gate dielectric is confirmed by the fact that the threshold voltage shift remains, when a pristine organic semiconductor is deposited on the exposed gate dielectric of a stressed and delaminated field-effect transistor.

引用

页码：5105 / +

页数：6

共 30 条

[11] Liquid-Crystalline Semiconducting Copolymers with Intramolecular Donor-Acceptor Building Blocks for High-Stability Polymer Transistors [J].

Kim, Do Hwan ;

Lee, Bang-Lin ;

Moon, Hyunsik ;

Kang, Hee Min ;

Jeong, Eun Jeong ;

Park, Jeong-Il ;

Han, Kuk-Min ;

Lee, Sangyoon ;

Yoo, Byung Wook ;

Koo, Bon Won ;

Kim, Joo Young ;

Lee, Wi Hyoung ;

Cho, Kilwon ;

Becerril, Hector Alejandro ;

Bao, Zhenan .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2009, 131 (17) :6124-6132

[12] Control of carrier density by self-assembled monolayers in organic field-effect transistors [J].

Kobayashi, S ;

Nishikawa, T ;

Takenobu, T ;

Mori, S ;

Shimoda, T ;

Mitani, T ;

Shimotani, H ;

Yoshimoto, N ;

Ogawa, S ;

Iwasa, Y .

NATURE MATERIALS, 2004, 3 (05) :317-322

[13] Scanning Kelvin probe microscopy on organic field-effect transistors during gate bias stress [J].

Mathijssen, S. G. J. ;

Coelle, M. ;

Mank, A. J. G. ;

Kemerink, M. ;

Bobbert, P. A. ;

de Leeuw, D. M. .

APPLIED PHYSICS LETTERS, 2007, 90 (19)

[14] Charge trapping at the dielectric of organic transistors visualized in real time and space [J].

Mathijssen, Simon G. J. ;

Kemerink, Martijn ;

Sharma, Abhinav ;

Coelle, Michael ;

Bobbert, Peter A. ;

Janssen, Rene A. J. ;

de Leeuw, Dago M. .

ADVANCED MATERIALS, 2008, 20 (05) :975-+

[15] Dynamics of threshold voltage shifts in organic and amorphous silicon field-effect transistors [J].

Mathijssen, Simon G. J. ;

Colle, Michael ;

Gomes, Henrique ;

Smits, Edsger C. P. ;

de Boer, Bert ;

McCulloch, Iain ;

Bobbert, Peter A. ;

de Leeuw, Dago M. .

ADVANCED MATERIALS, 2007, 19 (19) :2785-+

[16] High-performance solution-processed polymer ferroelectric field-effect transistors [J].

Naber, RCG ;

Tanase, C ;

Blom, PWM ;

Gelinck, GH ;

Marsman, AW ;

Touwslager, FJ ;

Setayesh, S ;

De Leeuw, DM .

NATURE MATERIALS, 2005, 4 (03) :243-248

[17] Comparing the kinetics of bias stress in organic field-effect transistors with different dielectric interfaces [J].

Ng, Tse Nga ;

Marohn, John A. ;

Chabinyc, Michael L. .

JOURNAL OF APPLIED PHYSICS, 2006, 100 (08)

[18] Electronic characterization of organic thin films by Kelvin probe force microscopy [J].

Palermo, V ;

Palma, M ;

Samorì, P .

ADVANCED MATERIALS, 2006, 18 (02) :145-164

[19] Photoinduced charge transfer across the interface between organic molecular crystals and polymers [J].

Podzorov, V ;

Gershenson, ME .

PHYSICAL REVIEW LETTERS, 2005, 95 (01)

[20] Threshold Voltage Shifts in Organic Thin-Film Transistors Due to Self-Assembled Monolayers at the Dielectric Surface [J].

Possanner, Stefan K. ;

Zojer, Karin ;

Pacher, Peter ;

Zojer, Egbert ;

Schuerrer, Ferdinand .

ADVANCED FUNCTIONAL MATERIALS, 2009, 19 (06) :958-967

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