In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics

被引：31

作者：

Tan, XL ^{[1
]}

Xu, ZK ^{[1
]}

Shang, JK ^{[1
]}

机构：

[1] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2001年 / 314卷 / 1-2期

关键词：

in situ TEM; domain switching; microcrack; PZT; ferroelectric ceramics;

D O I：

10.1016/S0921-5093(00)01911-0

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In situ transmission electron microscopy (TEM) technique was developed to examine micromechanisms of the electric fatigue in ferroelectric ceramics. The technique was based on a specially designed specimen connected to a modified TEM heating stage. With this technique, domain switching and nanodomain alignment near crack-like flaws were observed under cyclic electric fields. Following repeated electric cycles. microcracks were found to develop along domain and grain boundaries. (C) 2001 Elsevier Science B,V. All rights reserved.

引用

页码：157 / 161

页数：5

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