Epitaxial Heterostructures of Ultrathin Topological Insulator Nanoplate and Graphene

被引:203
作者
Dang, Wenhui [1 ]
Peng, Hailin [1 ]
Li, Hui [1 ]
Wang, Pu [1 ]
Liu, Zhongfan [1 ]
机构
[1] Peking Univ, Ctr Nanochem, State Key Lab Struct Chem Unstable & Stable Speci, BNLMS,Coll Chem & Mol Engn, Beijing 100871, Peoples R China
关键词
Topological insulator; graphene; Dirac materials; bismuth selenide; van der Waals epitaxy; DER-WAALS EPITAXY; SINGLE DIRAC CONE; ELECTRONIC-STRUCTURE; BISMUTH TELLURIDE; RAMAN; BI2SE3; STRAIN; BI2TE3; SB2TE3; GROWTH;
D O I
10.1021/nl100938e
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The authors present a van der Waals epitaxy of high-quality ultrathin nanoplates of topological insulator Bi2Se3 on a pristine graphene substrate using a simple vapor-phase deposition method. Sub-10-nm-thick nanoplates of layered Bi2Se3 with defined orientations can be epitaxially grown on a few-layer pristine graphene substrate. We show the evolution of Raman spectra with the number of Bi2Se3 layers on few-layer graphene. Bi2Se3 nanoplates with a thickness of three quintuple-layers (3-QL) exhibit the strongest Raman intensity. Strain effects in the Bi2Se3/graphene nanoplate heterostructures is also studied by Raman spectroscopy. 1-QL and 2-QL Bi2Se3 nanoplates experience tensile stress, consistent with compressive stress in single-layer and bilayer graphene substrates. Our results suggest an approach for the synthesis of epitaxial heterostructures that consist of an ultrathin topological insulator and graphene, which may be a new direction for electronic and spintronic applications.
引用
收藏
页码:2870 / 2876
页数:7
相关论文
共 59 条
[11]   Perspectives on Carbon Nanotubes and Graphene Raman Spectroscopy [J].
Dresselhaus, Mildred S. ;
Jorio, Ado ;
Hofmann, Mario ;
Dresselhaus, Gene ;
Saito, Riichiro .
NANO LETTERS, 2010, 10 (03) :751-758
[12]   Raman spectrum of graphene and graphene layers [J].
Ferrari, A. C. ;
Meyer, J. C. ;
Scardaci, V. ;
Casiraghi, C. ;
Lazzeri, M. ;
Mauri, F. ;
Piscanec, S. ;
Jiang, D. ;
Novoselov, K. S. ;
Roth, S. ;
Geim, A. K. .
PHYSICAL REVIEW LETTERS, 2006, 97 (18)
[13]   Influence of Phase Transformation on Stress Evolution during Growth of Metal Thin Films on Silicon [J].
Fillon, A. ;
Abadias, G. ;
Michel, A. ;
Jaouen, C. ;
Villechaise, P. .
PHYSICAL REVIEW LETTERS, 2010, 104 (09)
[14]   Topological insulators in three dimensions [J].
Fu, Liang ;
Kane, C. L. ;
Mele, E. J. .
PHYSICAL REVIEW LETTERS, 2007, 98 (10)
[15]   Superconducting proximity effect and Majorana fermions at the surface of a topological insulator [J].
Fu, Liang ;
Kane, C. L. .
PHYSICAL REVIEW LETTERS, 2008, 100 (09)
[16]   The rise of graphene [J].
Geim, A. K. ;
Novoselov, K. S. .
NATURE MATERIALS, 2007, 6 (03) :183-191
[17]  
HASAN MZ, 2002, ARXIV10023895V1
[18]   Observation of Time-Reversal-Protected Single-Dirac-Cone Topological-Insulator States in Bi2Te3 and Sb2Te3 [J].
Hsieh, D. ;
Xia, Y. ;
Qian, D. ;
Wray, L. ;
Meier, F. ;
Dil, J. H. ;
Osterwalder, J. ;
Patthey, L. ;
Fedorov, A. V. ;
Lin, H. ;
Bansil, A. ;
Grauer, D. ;
Hor, Y. S. ;
Cava, R. J. ;
Hasan, M. Z. .
PHYSICAL REVIEW LETTERS, 2009, 103 (14)
[19]   A tunable topological insulator in the spin helical Dirac transport regime [J].
Hsieh, D. ;
Xia, Y. ;
Qian, D. ;
Wray, L. ;
Dil, J. H. ;
Meier, F. ;
Osterwalder, J. ;
Patthey, L. ;
Checkelsky, J. G. ;
Ong, N. P. ;
Fedorov, A. V. ;
Lin, H. ;
Bansil, A. ;
Grauer, D. ;
Hor, Y. S. ;
Cava, R. J. ;
Hasan, M. Z. .
NATURE, 2009, 460 (7259) :1101-1105
[20]   Phonon softening and crystallographic orientation of strained graphene studied by Raman spectroscopy [J].
Huang, Mingyuan ;
Yan, Hugen ;
Chen, Changyao ;
Song, Daohua ;
Heinz, Tony F. ;
Hone, James .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2009, 106 (18) :7304-7308