Improvement of field-emission characteristics of carbon nanotubes by post electrical treatment

被引:7
作者
Baik, Chan-Wook [1 ]
Lee, Jeonghee
Chung, Deuk Seok
Jun, Seong Chan
Choi, Jun Hee
Song, Byung Kwon
Bae, Min Jong
Jeong, Tae Won
Heo, Jung Na
Jin, Yong Wan
Kim, Jong-Min
Yu, SeGi
Jang, Kyu-Ha
Park, Gun-Sik
机构
[1] Samsung Adv Inst Technol, Yongin 466712, South Korea
[2] Hankuk Univ Foreign Studies, Yongin 449791, South Korea
[3] Seoul Natl Univ, Sch Phys & Astron, Seoul 151747, South Korea
关键词
carbon nanotube (CNT); electrical treatment; field emission; uniformity;
D O I
10.1109/TED.2007.902236
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The field-emission characteristics of carbon nanotubes (CNTs), such as uniformity and brightness, were improved by electrical treatment using nonstationary electric fields between the cathode of screen-printed CNT emitters and the anode of a phosphor-coated indium-tin-oxide glass substrate in diode configuration. Dead or weak emission spots, where almost no emission of electrons was observed, started to emit electrons by applying an alternating-current voltage to the cathode electrode and a constant voltage to the anode electrode. The nonstationary electrical treatment was more effective than the direct-current (dc) and the square-pulsed electrical treatments for the emission uniformity and brightness. It was found that the nonstationary electrical treatment not only activated CNT emitters but also suppressed abnormally high emission spots without the drawbacks of electrical breakdown. Consequently, more than 1.8 and 1.3 times improvements of emission uniformity and brightness, respectively, were obtained after the treatment, when compared with the dc electrical treatment for the same amount of emission currents and the same duration of the treatments. Therefore, the method can be effectively applied to field-emission devices based on CNTs for the enhancement of emission properties.
引用
收藏
页码:2392 / 2402
页数:11
相关论文
共 23 条
[1]  
BAIK CW, 2006, Patent No. 200600040082
[2]   Degradation and failure of carbon nanotube field emitters [J].
Bonard, JM ;
Klinke, C ;
Dean, KA ;
Coll, BF .
PHYSICAL REVIEW B, 2003, 67 (11) :10
[3]   On-chip vacuum microtriode using carbon nanotube field emitters [J].
Bower, C ;
Zhu, W ;
Shalom, D ;
Lopez, D ;
Chen, LH ;
Gammel, PL ;
Jin, S .
APPLIED PHYSICS LETTERS, 2002, 80 (20) :3820-3822
[4]   Field emission image uniformity improvement by laser treating carbon nanotube powders [J].
Chen, K. F. ;
Chen, K. C. ;
Jiang, Y. C. ;
Jiang, L. Y. ;
Chang, Y. Y. ;
Hsiao, M. C. ;
Chan, L. H. .
APPLIED PHYSICS LETTERS, 2006, 88 (19)
[5]   Optimization of electron beam focusing for gated carbon nanotube field emitter arrays [J].
Choi, JH ;
Zoulkarneev, AR ;
Park, YJ ;
Chung, DS ;
Song, BK ;
Kang, HS ;
Baik, CW ;
Han, IT ;
Kim, HJ ;
Shin, MJ ;
Kim, HJ ;
Oh, TS ;
Jin, YW ;
Kim, JM ;
Lee, N .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (12) :2584-2590
[6]   Fully sealed, high-brightness carbon-nanotube field-emission display [J].
Choi, WB ;
Chung, DS ;
Kang, JH ;
Kim, HY ;
Jin, YW ;
Han, IT ;
Lee, YH ;
Jung, JE ;
Lee, NS ;
Park, GS ;
Kim, JM .
APPLIED PHYSICS LETTERS, 1999, 75 (20) :3129-3131
[7]   Carbon nanotube electron emitters with a gated structure using backside exposure processes [J].
Chung, DS ;
Park, SH ;
Lee, HW ;
Choi, JH ;
Cha, SN ;
Kim, JW ;
Jang, JE ;
Min, KW ;
Cho, SH ;
Yoon, MJ ;
Lee, JS ;
Lee, CK ;
Yoo, JH ;
Kim, JM ;
Jung, JE ;
Jin, YW ;
Park, YJ ;
You, JB .
APPLIED PHYSICS LETTERS, 2002, 80 (21) :4045-4047
[8]   A simple and robust electron beam source from carbon nanotubes [J].
Collins, PG ;
Zettl, A .
APPLIED PHYSICS LETTERS, 1996, 69 (13) :1969-1971
[9]   Work function at the tips of multiwalled carbon nanotubes [J].
Gao, RP ;
Pan, ZW ;
Wang, ZL .
APPLIED PHYSICS LETTERS, 2001, 78 (12) :1757-1759
[10]   Mechanism responsible for initiating carbon nanotube vacuum breakdown [J].
Huang, NY ;
She, JC ;
Chen, J ;
Deng, SZ ;
Xu, NS ;
Bishop, H ;
Huq, SE ;
Wang, L ;
Zhong, DY ;
Wang, EG ;
Chen, DM .
PHYSICAL REVIEW LETTERS, 2004, 93 (07) :075501-1