Quantitative scanning evanescent microwave microscopy and its applications in characterization of functional materials libraries

被引:55
作者
Gao, C [1 ]
Hu, B
Takeuchi, I
Chang, KS
Xiang, XD
Wang, G
机构
[1] Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Anhui, Peoples R China
[2] Univ Sci & Technol China, Struct Res Lab, Hefei 230029, Anhui, Peoples R China
[3] Univ Maryland, Small Smart Syst Ctr, Dept Mat Sci & Engn, College Pk, MD 20742 USA
[4] Univ Maryland, Ctr Superconduct Res, College Pk, MD 20742 USA
[5] Intematix Corp, Moraga, CA 94556 USA
关键词
combinatorial material science; high-throughput characterization; scanning evanescent microwave microscopy; near-field microscopy; dielectric/ferroelectric materials; dielectric constant; electric impedance;
D O I
10.1088/0957-0233/16/1/033
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper gives a comprehensive review on the advances in the field of scanning evanescent microwave microscopy, as a high-throughput characterization tool for electrical properties. Theoretical model analyses used for performing quantitative non-destructive characterization of various materials are presented. Examples of applications of the microwave microscopy to the rapid measurements of dielectric/ferroelectric libraries are given.
引用
收藏
页码:248 / 260
页数:13
相关论文
共 57 条
[1]   Development of a dual-channel scanning microwave/optical microprobe [J].
Aga, RS ;
Brookman, J ;
Dizon, J ;
Wu, JZ .
APPLIED PHYSICS LETTERS, 2004, 84 (11) :1979-1981
[2]  
Akporiaye DE, 1998, ANGEW CHEM INT EDIT, V37, P609, DOI 10.1002/(SICI)1521-3773(19980316)37:5<609::AID-ANIE609>3.0.CO
[3]  
2-X
[4]   SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].
ASH, EA ;
NICHOLLS, G .
NATURE, 1972, 237 (5357) :510-&
[5]   A CLASS OF COBALT OXIDE MAGNETORESISTANCE MATERIALS DISCOVERED WITH COMBINATORIAL SYNTHESIS [J].
BRICENO, G ;
CHANG, HY ;
SUN, XD ;
SCHULTZ, PG ;
XIANG, XD .
SCIENCE, 1995, 270 (5234) :273-275
[6]   NONCONTACT TECHNIQUE FOR LOCAL MEASUREMENT OF SEMICONDUCTOR RESISTIVITY [J].
BRYANT, CA ;
GUNN, JB .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1965, 36 (11) :1614-&
[7]   A low-loss composition region identified from a thin-film composition spread of (Ba1-x-ySrxCay) TiO3 [J].
Chang, H ;
Takeuchi, I ;
Xiang, XD .
APPLIED PHYSICS LETTERS, 1999, 74 (08) :1165-1167
[8]   Combinatorial synthesis and high throughput evaluation of ferroelectric/dielectric thin-film libraries for microwave applications [J].
Chang, H ;
Gao, C ;
Takeuchi, I ;
Yoo, Y ;
Wang, J ;
Schultz, PG ;
Xiang, XD ;
Sharma, RP ;
Downes, M ;
Venkatesan, T .
APPLIED PHYSICS LETTERS, 1998, 72 (17) :2185-2187
[9]   Exploration of artificial multiferroic thin-film heterostructures using composition spreads [J].
Chang, KS ;
Aronova, MA ;
Lin, CL ;
Murakami, M ;
Yu, MH ;
Hattrick-Simpers, J ;
Famodu, OO ;
Lee, SY ;
Ramesh, R ;
Wuttig, M ;
Takeuchi, I ;
Gao, C ;
Bendersky, LA .
APPLIED PHYSICS LETTERS, 2004, 84 (16) :3091-3093
[10]   Multimode quantitative scanning microwave microscopy of in situ grown epitaxial Ba1-xSrxTiO3 composition spreads [J].
Chang, KS ;
Aronova, M ;
Famodu, O ;
Takeuchi, I ;
Lofland, SE ;
Hattrick-Simpers, J ;
Chang, H .
APPLIED PHYSICS LETTERS, 2001, 79 (26) :4411-4413